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Publications of Vision and Fusion Laboratory
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Philipp, P.Technical report. In: Proceedings of the 2016 Joint Workshop of Fraunhofer IOSB and Institute for Anthropomatics, Vision and Fusion Laboratory, pp. 1-16, 2017.
Philipp, P.; Bleier, J.; Fischer, Y.; Beyerer, J.Radermacher, K.; Baena, F. R. Y. (eds.), CAOS 2017. 17th Annual Meeting of the International Societyfor Computer Assisted Orthopaedic Surgery, EPiC Series in Health Sciences, vol. 1, pp. 288--294, 2017.
Philipp, P.; Beyerer, J.; Fischer, Y.Cognitive and Computational Aspects of Situation Management(CogSIMA), 2017 IEEE Conference on, pp. 1--7, 2017.
Krempel, E.; Birnstill, P.; Beyerer, J.European Journal for Security Research online first, Springer, 2017.
Retzlaff, M.-G.; Hanika, J.; Beyerer, J.; Dachsbacher, C.Journal of Sensors and Sensor Systems 6 no. 1, pp. 171-184, 2017.
Jarvis, J.; Haertelt, M.; Hugger, S.; Butschek, L.; Fuchs, F.; Ostendorf, R.; Wagner, J.; Beyerer, J.Advanced Optical Technologies 6 no. 2, pp. 85--93, 2017.
Herrmann, C.; Willersinn, D.; Beyerer, J.Image Analysis - 20th Scandinavian Conference, SCIA 2017 (Lecture Notes in Computer Science 10269), pp. 377-388, Springer, 2017.
Sommer, L. W.; Schuchert, T.; Beyerer, J.Proc. SPIE 10202, Automatic Target Recognition XXVII, 2017.
Hild, J.; Krüger, W.; Brüstle, S.; Trantelle, P.; Unmüßig, G.; Voit, M.; Heinze, N.; Peinsipp-Byma, E.; Beyerer, J.Proc. SPIE 10199, Geospatial Informatics, Fusion, and Motion Video Analytics VII, pp. 1019903-1019903-9, 2017.
Maier, S.; Camp, F. v. d.; Hafermann, J.; Wagner, B.; Peinsipp-Byma, E.; Beyerer, J.Proc. SPIE 10190, Ground/Air Multisensor Interoperability, Integration, and Networking for Persistent ISR VIII, pp. 101901D-101901D-10, 2017.
Maier, G.; Pfaff, F.; Becker, F.; Pieper, C.; Gruna, R.; Noack, B.; Kruggel-Emden, H.; Längle, T.; Hanebeck, U.; Wirtz, S.; Scherer, V.; Beyerer, J.KIT Scientific Publishing, K. (ed.), Proceedings of the 3rd Conference on Optical Characterization of Materials (OCM 2017), 2017.
Luo, D.; Taphanel, M.; Längle, T.; Beyerer, J.Applied Optics 56 no. 8, pp. 2155-3165, OSA, 2017.
Qu, C.; Herrmann, C.; Monari, E.; Schuchert, T.; Beyerer, J.Proceedings of the 17th IEEE Winter Conference on Applications of Computer Vision (WACV), pp. 1105--1114, IEEE, 2017.
Frühberger, P.; Stephan, T.; Burke, J.; Beyerer, J.Oral, A. Y.; Bahsi Oral, Z. B. (eds.), 3rd International Multidisciplinary Microscopy and Microanalysis Congress (InterM): Proceedings, Oludeniz, Turkey, 19-23 October 2015, pp. 223--228, Springer International Publishing, 2017.
Beyerer, J.; Usländer, T.at - Automatisierungstechnik 64 no. 9, pp. 697-698, De Gruyter, 2016.
Fischer, Y.Dissertation, KIT Scientific Publishing, Karlsruhe, 2016.
Azaiez, S.; Boc, M.; Loic Cudennec, .; Simoes, M. D. S.; Haupert, J.; Kchir, S.; Klinge, X.; Labidi, W.; Nahhal, K.; Pfrommer, J.; Schleipen, M.; Schulz, C.; Tortech, T.Procedia Computer Science 83, pp. 1268-1273, Elsevier, 2016.
Philipp, P.Technical report. In: Proceedings of the 2015 Joint Workshop of Fraunhofer IOSB and Institute for Anthropomatics, Vision and Fusion Laboratory, pp. 1-16, KIT Scientific Publishing, Karlsruhe, 2016.
Woock, P.Dissertation, KIT Scientific Publishing, Karlsruhe, 2016.
Luo, D.; Längle, T.; Beyerer, J.Forum Bildverarbeitung 2016, pp. 185-195, 2016.
Meyer, J.; Längle, T.; Beyerer, J.tm - Technisches Messen 83 no. 12, pp. 731-738, De Gruyter, 2016.
Meyer, J.; Längle, T.; Beyerer, J.Forum Bildverarbeitung 2016, pp. 75-86, 2016.
Herrmann, C.; Willersinn, D.; Beyerer, J.Proceedings of the 2016 International Conference on Digital Image Computing: Techniques and Applications (DICTA), pp. 244-250, IEEE, 2016.
Deppe, T.; Palm, F.; Grüner, S.; Pfrommer, J.Kommunikation in der Automation - KommA 2016, 2016.
Pfrommer, J.2nd International Workshop on Interoperability and Open-Source Solutions for the Internet of Things (InterOSS-IoT), 2016.
Grüner, S.; Pfrommer, J.; Palm, F.IEEE Transactions on Industrial Informatics 12 no. 5, pp. 1832-1841, IEEE, 2016.
Meshram, A.; Haas, C.Machine Learning for Cyber Physical Systems 2016 , pp. 65-72, 2016.
Schleipen, M.; Pfrommer, J.Automation 2016 - "Secure & reliable in the digital world" : 17. Branchentreff der Mess- und Automatisierungstechnik, pp. 123-133, 2016.
Schleipen, M.; Gilani, S.-S.; Bischoff, T.; Pfrommer, J.49th CIRP Conference on Manufacturing Systems (CIRP-CMS 2016), CIRP, 2016.
Wagner, P. G.; Birnstill, P.; Krempel, E.; Bretthauer, S.; Beyerer, J.Springer, (ed.), Informatik 2016 – Informatik von Menschen für Menschen, GI-Edition: Lecture Notes in Informatics (LNI), pp. 427-440, Springer, 2016.
Beyerer, J.; Geisler, J.European Journal of Security Research 1 no. 2, pp. 135-150, Springer, 2016.
Richter, M.; Längle, T.; Beyerer, J.Proceedings of the 23rd International Conference on Patter Recognition, 2016.
Sommer, L. W.; Schuchert, T.; Beyerer, J.2016.
Retzlaff, M.-G.; Richter, M.; Längle, T.; Beyerer, J.; Dachsbacher, C.Forum Bildverarbeitung 2016, 2016.
Ziehn, J.; Ruf, M.; Rosenhahn, B.; Willersinn, D.; Beyerer, J.; Gotzig, H.Proceedings of the IEEE 19th International Conference on Intelligent Transportation Systems (ITSC 2016), pp. 1410-1417, IEEE, 2016.
Sommer, L. W.; Schuchert, T.; Beyerer, J.Proc. SPIE 9988, Electro-Optical Remote Sensing X, 99880N, 2016.
Dunau, P.; Beyerer, J.Proceedings of the 19th International Conference on Information Fusion (FUSION), pp. 1735-1742, IEEE, 2016.
Kuwertz, A.; Beyerer, J.Journal of Applied Logic 19 no. 2, pp. 102-127, Elsevier, 2016.
Pfrommer, J.NIPS Workshop on Learning, Inference and Control of Multi-Agent Systems, 2016.
Pfrommer, J.; Grüner, S.; Goldschmidt, T.; Schulz, D.at-Automatisierungstechnik 64 no. 9, pp. 729-741, De Gruyter, 2016.
Fischer, Y.; Krempel, E.; Birnstill, P.; Unmüßig, G.; Monari, E.; Moßgraber, J.; Schenk, M.; Beyerer, J.Proceedings of the 9th Future Security 2014. Security Research Conference, pp. 91-99, Fraunhofer Verlag, Stuttgart, 2016.
Philipp, P.; Schreiter, L.; Giehl, J.; Fischer, Y.; Raczkowsky, J.; Schwarz, M.; Wörn, H.; Beyerer, J.6th Joint Workshop on New Technologies for Computer/Robot Assisted Surgery at CRAS 2016, pp. 45-46, 2016.
Pfrommer, J.; Schleipen, M.; Azaiez, S.; Boc, M.; Kling, X.Emerging Technologies and Factory Automation (ETFA), 2016 IEEE 21st International Conference on, pp. 1-7, IEEE, 2016.
Ruf, M.; Ziehn, J.; German, L.; Rosenhah, B.; Willersinn, D.; Beyerer, J.; Gotzig, H.Proceedings of the IEEE International Conference on Instrumentation, Control and Automation (ICA 2016), pp. 189-196, IEEE, 2016.
Richter, M.; Maier, G.; Gruna, R.; Längle, T.; Beyerer, J.Proceedings of the 2nd World Congress on Electrical Engineering and Computer Systems and Science (EECSS’16), pp. 104.1-104.8, Avestia Publishing, 2016.
Birnstill, P.; Bier, C.; Wagner, P.; Beyerer, J.Proceedings of the International Conference on Security and Management, SAM 2016, pp. 185-191, CSREA Press, 2016.
Remondino, F.; Shortis, M.; Beyerer, J.; León, F. P. (eds.)SPIE Optical Metrology, 2016.
Pfrommer, J.; Grüner, S.; Palm, F.Factory Communication Systems (WFCS), 2016 IEEE World Conference on, pp. 1-7, IEEE, 2016.
Retzlaff, M.-G.; Hanika, J.; Beyerer, J.; Dachsbacher, C.Sensoren und Messsysteme 2016, 2016.
Niggemann, O.; Beyerer, J. (eds.)Springer, 2016.
Herrmann, C.; Müller, T.; Willersinn, D.; Beyerer, J.lProc. SPIE 9987, Electro-Optical and Infrared Systems: Technoogy and Applications, 99870I, 2016.
Herrmann, C.; Willersinn, D.; Beyerer, J.Proceedings of the 13th IEEE International Conference on Advanced Video and Signal Based Surveillance, IEEE, 2016., IEEE, 2016.
Meyer, J.Technical report. In: Proceedings of the 2015 Joint Workshop of Fraunhofer IOSB and Institute for Anthropomatics, Vision and Fusion Laboratory, pp. 103-112, 2016.
Meyer, J.; Längle, T.; Beyerer, J.Proceedings of the 2nd International Conference on Frontiers of Signal Processing (ICFSP 2016), pp. 104-109, 2016.
Anneken, M.; Fischer, Y.; Beyerer, J.Proceedings of the 8th International Conference on Agents and Artificial Intelligence, pp. 250-257, 2016.
Anneken, M.; Fischer, Y.; Beyerer, J.Bi, Y.; Kapoor, S.; Bhatia, R. (eds.), Intelligent Systems and Applications, vol. 650, pp. 89-107, Springer International Publishing, 2016.
Bergmann, S.; Mohammadikaji, M.; and Irgenfried, S.; Wörn, H.; Beyerer, J.; Dachsbacher, C.Hullin, M.; Stamminger, M.; Weinkauf, T. (eds.), Vision, Modeling Visualization, The Eurographics Association, 2016.
Mohammadikaji, M.; Bergmann, S.; Irgenfried, S.; Beyerer, J.; Dachsbacher, C.; Wörn, H.XXX Messtechnisches Symposium, De Gruyter, 2016.
Mohammadikaji, M.; Bergmann, S.; Irgenfried, S.; Beyerer, J.; Dachsbacher, C.; Wörn, H.2016 IEEE International Instrumentation and Measurement Technology Conference Proceedings, pp. 1--6, 2016.
Anneken, M.; Fischer, Y.; Beyerer, J.Security Research Conference 11th Future Security, pp. 331-337, Fraunhofer Verlag, 2016.
Broadnax, B.; Birnstill, P.; Müller-Quade, J.; Beyerer, J.Security Research Conference 11th Future Security, pp. 323-330, Fraunhofer Verlag, 2016.
Krempel, E.; Birnstill, P.; Beyerer, J.Security Research Conference 11th Future Security, pp. 315-322, Fraunhofer Verlag, 2016.
Bier, C.; Beyerer, J.Security Research Conference 11th Future Security, pp. 293-298, Fraunhofer Verlag, 2016.
Hammer, J. H.; Qu, C.; Voit, M.; Beyerer, J.20th International Conference on Image Processing, Computer Vision, & Pattern Recognition, 2016.
Hammer, J. H.; Voit, M.; Beyerer, J.2016 19th International Conference on Information Fusion (FUSION), pp. 1743-1750, 2016.
Meyer, J.; Längle, T.; Beyerer, J.Irish Machine Vision & Image Processing Conference Proceedings 2016, pp. 9-16, 2016.
Meyer, J.; Gruna, R.; Längle, T.; Beyerer, J.Electronic Imaging 2016 no. 19, pp. 1-9, 2016.
Luo, D.; Bauer, S.; Taphanel, M.; Längle, T.; León, F. P.; Beyerer, J.Proceedings of SPIE Next-Generation Spec, pp. 98550P-98550P-9, SPIE, 2016.
Philipp, P.; Fischer, Y.; Hempel, D.; Beyerer, J.Emerging Trends in Applications and Infrastructures for Computational Biology, Bioinformatics, and Systems Biology, pp. 371-390, Elsevier, 2016.
Qu, C.; Luo, D.; Monari, E.; Schuchert, T.; Beyerer, J.Proceedings of the 23rd IEEE International Conference on Image Processing (ICIP), IEEE, 2016.
Schreiter, L.; Philipp, P.; Giehl, J.; Fischer, Y.; Raczkowsky, J.; Schwarz, M.; Beyerer, J.; Wörn, H.Proceedings of Computer Assisted Radiology and Surgery (CARS), 2016.
Sommer, L. W.; Teutsch, M.; Schuchert, T.; Beyerer, J.Proceedings of the IEEE Winter Conference on Applications of Computer Vision (WACV), 2016, pp. 1-9, IEEE, 2016.
Richter, M.; Vieth, K.-U.; Längle, T.; Beyerer, J.Proceedings of the 7th Sensor-Based Sorting & Control 2016, pp. 169-177, 2016.
Beyerer, J.; Puente León, F.; Frese, C.Springer, 2016.
Ruf, M.Technical report. In: Proceedings of the 2015 Joint Workshop of Fraunhofer IOSB and Institute for Anthropomatics, Vision and Fusion Laboratory, pp. 41-69, 2015.
Taphanel, M.; Beyerer, J.tm Technisches Messen 82 no. 2, pp. 94-101, Oldenbourg Wissenschaftsverlag, 2015.
Dunau, P.; Fitz, D.; Beyerer, J.tm Technisches Messen 82 no. 5, pp. 262-272, Oldenbourg Wissenschaftsverlag, 2015.
Retzlaff, M.-G.; Stabenow, J.; Beyerer, J.; Dachsbacher, C.tm Technisches Messen 82 no. 3, pp. 251-261, Oldenbourg Wissenschaftsverlag, 2015.
Richter, M.; Längle, T.; Beyerer, J.tm Technisches Messen 82 no. 2, pp. 663-671, Oldenbourg Wissenschaftsverlag, 2015.
Rauschenbach, T.; Beyerer, J.at-Automatisierungstechnik 63 no. 5, pp. 232-324, Oldenbourg Wissenschaftsverlag, 2015.
Monari, E.; Fischer, Y.; Anneken, M.Proceedings of the 10th Security Research Conference (Future Security), pp. 49-56, Fraunhofer Verlag, 2015.
Grasemann, G.; Anneken, M.; Peinsipp-Byma, E.Proceedings of the 10th Security Research Conference (Future Security), pp. 325-331, Fraunhofer Verlag, 2015.
Anneken, M.; Teutsch, M.; Brüstle, S.; Unmüßig, G.; Schuchert, T.; Fischer, Y.Proceedings of the NATO Symposium on Information Fusion (Hard and Soft) for Intelligence, Surveillance Reconnaissance (IST-SET-126), 2015.
Anneken, M.; Fischer, Y.; Beyerer, J.Proceedings of 2015 SAI Intelligent Systems Conference (IntelliSys), 2015.
Qu, C.; Gao, H.; Ekenel, H. K.EURASIP Journal on Image and Video Processing 2015 no. 1, pp. 1-12, Springer, 2015.
Ruf, M.; Ziehn, J.; Willersinn, D.; Rosenhahn, B.; Beyerer, J.; Gotzig, H.Proceedings of the 18th International IEEE Conference on Intelligent Transportation Systems ITSC: Smart Mobility for Safety and Sustainability, pp. 1908-1914, IEEE, 2015.
Birnstill, P.; Burkert, C.; Beyerer, J.Proceedings of the 10th Future Security: Security Research Conference, Fraunhofer Verlag, Stuttgart, 2015.
Krempel, E.; Beyerer, J.Proceedings of the 10th Future Security: Security Research Conference, pp. 65-72, Fraunhofer Verlag, Stuttgart, 2015.
Pfaff, F.; Baum, M.; Noack, B.; Hanebeck, U. D.; Gruna, R.; Längle, T.; Beyerer, J.Multisensor Fusion and Integration for Intelligent Systems (MFI), 2015 IEEE International Conference on, pp. 7--12, 2015.
Jonietz, C.; Monari, E.; Qu, C.Proceedings of the 14th International Conference of the Biometrics Special Interest Group (BIOSIG), pp. 1-8, 2015.
Ziehn, J.; Ruf, M.; Rosenhahn, B.; Willersinn, D.; Beyerer, J.; Gotzig, H.10. Workshop Fahrerassistenzsysteme (FAS 2015), pp. 71-83, Uni-DAS e.V., Darmstadt , 2015.
Jonietz, C.; Monari, E.; Widak, H.; Qu, C.Proceedings of the 12th IEEE International Conference on Advanced Video and Signal based Surveillance (AVSS) Workshops Karlsruhe, pp. 1-6, IEEE, 2015.
Huber, M.Dissertation, Karlsruher Schriften zur Anthropomatik, vol. 19, KIT Scientific Publishing, Karlsruhe, 2015.
Klusch, M.; Meshram, A.; Schuetze, A.; Helwig, N.Proceedings of the 11th International Conference on Semantic Systems, pp. 81--88, 2015.
Sommer, L. W.; Raghavan, A.; Kiesel, P.; Saha, B.; Schwartz, J.; Lochbaum, A.; Ganguli, A.; Bae, C.-J.; Alamgir, M.Journal of The Electrochemical Society 162 no. 14, pp. A2664--A2669, The Electrochemical Society, 2015.
Sommer, L. W.; Kiesel, P.; Ganguli, A.; Lochbaum, A.; Saha, B.; Schwartz, J.; Bae, C.-J.; Alamgir, M.; Raghavan, A.Journal of Power Sources 296, pp. 46--52, Elsevier, 2015.
Beyerer, J.; Jasperneite, J.; Sauer, O.at Automatisierungstechnik 10 no. 63, pp. 751-752, De Gruyter, 2015.
Meyer, J.Technical report. In: Proceedings of the 2014 Joint Workshop of Fraunhofer IOSB and Institute for Anthropomatics, Vision and Fusion Laboratory, pp. 37-47, KIT Scientific Publishing, Karlsruhe, 2015.
Philipp, P.; Fischer, Y.; Hempel, D.; Beyerer, J.CSCI 2015, International Conference on Computational Science and Computational Intelligence: ISHI 2015, International Symposium on Health Informatics and Medical Systems, december 7-9, Las Vegas, Neva, pp. 3-9, 2015.
Philipp, P.; Eck, R.; Peinsipp-Byma, E.GOCICT 2015, Global Online Conference on Information and Computer Technology, november 4-6, 2015.
Philipp, P.; Fischer, Y.; Hempel, D.; Beyerer, J.WorldComp 2015, World Congress in Computer Science, Computer Engineering, and Applied Computing : HIMS 2015, International Conference on Health Informatics and Medical Systems, july 27-30, Las Vegas, , pp. 3-9, 2015.
Herrmann, C.; Qu, C.; Beyerer, J.Proceedings of the 4th IEEE International Conference on Signal and Image Processing Applications, 2015, IEEE, 2015.
Herrmann, C.; Qu, C.; Willersinn, D.; Beyerer, J.Proceedings of the 12th IEEE International Conference on Advanced Video and Signal Based Surveillance, IEEE, 2015.
Qu, C.; Monari, E.; Schuchert, T.; Beyerer, J.Proceedings of the 26th British Machine Vision Conference (BMVC), pp. 87.1-87.12, BMVA Press, 2015.
Herrmann, C.; Metzler, J.; Willersinn, D.; Beyerer, J.Proceedings of the 10th Future Security, 2015, 2015.
Grüner, S.; Pfrommer, J.; Palm, F.IEEE, (ed.), Factory Communication Systems (WFCS), 2015 IEEE World Conference on, pp. 1--4, 2015.
Pfrommer, J.; Stogl, D.; Aleksandrov, K.; Navarro, S. E.; Hein, B.; Beyerer, J.at Automatisierungstechnik 10 no. 63, De Gruyter, 2015.
Pfrommer, J.Technical report. In: Proceedings of the 2014 Joint Workshop of Fraunhofer IOSB and Institute for Anthropomatics, Vision and Fusion Laboratory, pp. 77-87, KIT Scientific Publishing, Karlsruhe, 2015.
Frühberger, P.; Stephan, T.; Beyerer, J. 2nd International Multidisciplinary Microscopy and Microanalysis Congress, Springer Proceedings in Physics, vol. 164, pp. 57-64, Springer International Publishing, 2015.
Beyerer, J.; Geisler, J.Beyerer, J.; Meissner, A.; Geisler, J. (eds.), Proceedings of the 10th Future Security, 2015, pp. 317-324, Stuttgart: Fraunhofer Verlag, 2015.
Beyerer, J.; Meissner, A.; Geisler, J. (eds.)Fraunhofer Verlag, 2015.
Birnstill, P.; Ren, D.; Beyerer, J.2015 12th IEEE International Conference on Advanced Video and Signal-Based Surveillance (AVSS), pp. 1-6, IEEE, 2015.
Beyerer, J.; Pak, A. (eds.)Karlsruher Schriften zur Anthropomatik, vol. 20, KIT Scientific Publishing, 2015.
Beyerer, J.; León, F. P. (eds.)SPIE, Bellingham, Washington, 2015.
Qu, C.; Gao, H.; Monari, E.; Beyerer, J.; Thiran, J.-P.Proceedings of the 28th IEEE Conference on Computer Vision and Pattern Recognition Workshops (CVPRW), pp. 1-9, IEEE, 2015.
Woock, P.; Beyerer, J.Proceedings of the 3rd Underwater Acoustics Conference and Exhibition 2015, 2015.
Qu, C.; Herrmann, C.; Monari, E.; Schuchert, T.; Beyerer, J.Proceedings of the 12th Conference on Computer and Robot Vision (CRV), pp. 139-146, IEEE, 2015.
Taphanel, M.; Zink, R.; Längle, T.; Beyerer, J.SPIE 9525, Optical Measurement Systems for Industrial Inspection IX, pp. 95250Y-95250Y, 2015.
Herrmann, C.; Beyerer, J.Proceedings of the 12th Conference on Computer Robot Vision (CRV), pp. 192-199, 2015.
Ziehn, J.; Ruf, M.; Rosenhahn, B.; Willersinn, D.; Beyerer, J.; Gotzig, H.Proceedings of IEEE Intelligent Vehicles Symposium (IV 2015), pp. 380-385, IEEE, 2015.
Janya-Anurak, C.; Bernard, T.; Beyerer, J.Proceedings of the 1st International Conference on Uncertainty Quantification in Computational Sciences and Engineering, pp. 702-713, IEEE , 2015.
Richter, M.; Längle, T.; Beyerer, J.Proceedings of the 14th IAPR International Conference on Machine Vision Applications, pp. 210-213, 2015.
Woock, P.; Stephan, T.; Beyerer, J.at - Automatisierungstechnik 63 no. 5, pp. 334-343, Oldenbourg Wissenschaftsverlag, 2015.
Kuwertz, A.; Goldbeck, C.; Hug, R.; Beyerer, J.Proceedings of the UKSIM-AMSS 17th International Conference on Modelling and Simulation (UKSim2015) 2015, pp. 165-170, 2015.
Richter, M.; Beyerer, J.Beyerer, J.; León, F. P.; Längle, T. (eds.), OCM 2015 - Optical Characterization of Materials - conference proceedings , pp. 103-112, KIT Scientific Publishing, 2015.
Walocha, J.; Richter, M.Beyerer, J.; León, F. P.; Längle, T. (eds.), OCM 2015 - Optical Characterization of Materials - conference proceedings , pp. 137-145, KIT Scientific Publishing, 2015.
Beyerer, J.; Puente León, F.; Längle, T. (eds.)Karlsruhe: KIT Scientific Publishing, 2015.
Qu, C.; Monari, E.; Schuchert, T.; Beyerer, J.Proceedings of SPIE 9405, SPIE/IS&T Electronic Imaging 2015, Image Processing: Machine Vision Applications VIII, pp. 94050P-94050P-9, 2015.
Herrmann, C.; Beyerer, J.Proc. SPIE 9405, Image Processing: Machine Vision Applications VIII, 940507, 2015.
Richter, M.; Längle, T.; Beyerer, J.tm -Technisches Messen 82 no. 3, pp. 135-144, 2015.
Fischer, Y.; Reiswich, A.; Beyerer, J.Proceedings of the International Conference on Cognitve Methods in Situation Awareness and Decision Support, pp. 209-215, IEEE, 2014.
Krempel, E.; Beyerer, J.Lecture Notes in Computer Science Volume 8450, pp. 86-100, Springer International Publishing, 2014.
Sommer, L. W.; Raghavan, A.; Kiesel, P.; Saha, B.; Staudt, T.; Lochbaum, A.; Ganguli, A.; Bae, C.-J.; Alamgir, M.MRS Proceedings, vol. 1681, pp. mrss14--1681, 2014.
Lochbaum, A.; Kiesel, P.; Sommer, L. W.; Bae, C.-J.; Staudt, T.; Saha, B.; Raghavan, A.; Lieberman, R.; Delgado, J.; Choi, B.; Alamgir, M.Symposium Q – Materials, Technologies and Sensor Concepts for Advanced Battery Management Systems, MRS Proceedings, vol. 1681, 2014.
Vogelbacher, M.Technical report IES-2013-12. In: Beyerer, J.; Pak, A. (eds.), Proceedings of the 2013 Joint Workshop of Fraunhofer IOSB and Institute for Anthropomatics, Vision and Fusion Laboratory, Karlsruher Schriften zur Anthropomatik, vol. 17, pp. 139-153, KIT Scientific Publishing, 2014.
Kühnert, C.; Beyerer, J.Machines 2014 2 no. 4, pp. 255-274, 2014.
Janya-anurak, C.Technical report IES-2013-03. In: Beyerer, J.; Pak, A. (eds.), Proceedings of the 2013 Joint Workshop of Fraunhofer IOSB and Institute for Anthropomatics, Vision and Fusion Laboratory, Karlsruher Schriften zur Anthropomatik, vol. 17, pp. 25-40, KIT Scientific Publishing, 2014.
Ziebarth, M.Technical report IES-2013-13. In: Beyerer, J.; Pak, A. (eds.), Proceedings of the 2013 Joint Workshop of Fraunhofer IOSB and Institute for Anthropomatics, Vision and Fusion Laboratory, Karlsruher Schriften zur Anthropomatik, pp. 155-169, KIT Scientific Publishing, 2014.
Herrmann, C.; Beyerer, J.Lecture Notes in Computer Science 8888, Advances in Visual Computing, 10th International Symposium, ISVC 2014, Proceedings, Part II, pp. 304-314, 2014.
Balzer, J.; Acevedo-Feliz, D.; Soatto, S.; Höfer, S.; Hadwiger, M.; Beyerer, J.Proceedings of the 2014 Second International Conference on 3D Vision, IEEE, 2014.
Vogelbacher, M.; Schulte, H.; Heber, E.; Beyerer, J.Proceedings of the 12th International Symposium on Sophisticated Car Occupant Safety Systems, 2014.
Vogelbacher, M.; Ziebarth, M.; Olawsky, S.; Beyerer, J.Puente León, F.; Heizmann, M. (eds.), Forum Bildverarbeitung, pp. 129-140, KIT Scientific Publishing, 2014.
Richter, M.; Beyerer, J.Puente León, F.; Heizmann, M. (eds.), Forum Bildverarbeitung, pp. 107-118, KIT Scientific Publishing, 2014.
Ruf, M.; Ziehn, J. R.; Willersinn, D.; Rosenhahn, B.; Beyerer, J.; Gotzig, H.Proceedings of the Conference on Vehicle and Infrastructure Safety Improvement in Adverse Conditions and Night Driving (VISION 2014), 2014.
Taphanel, M.Leitfaden zur optischen 3D-Messtechnik no. 14, pp. 39-41, Fraunhofer Verlag, Stuttgart, 2014.
Frühberger, P.; Peinsipp-Byma, D. E.; Ijsselmiden, J.; Michael, D. H.Patentschrift DE 102013206546 A1, 2014.
Taphanel, M.; Beyerer, J.XXVIII. Messtechnisches Symposium des Arbeitskreises der Hochschullehrer für Messtechnik e.V., Shaker, 2014.
Woock, P.; Beyerer, J.Proceedings of IEEE/MTS Oceans 2014, 2014.
Stephan, T.; Beyerer, J.2014 ICPR Workshop on Computer Vision for Analysis of Underwater Imagery (CVAUI), pp. 73-79, 2014.
Pak, A.Proc. SPIE 9203, Interferometry XVII: Techniques and Analysis, 92030E, 2014.
Waibel, P.; Vogelbacher, M.; Matthes, J.; Keller, H.Proceedings of the 11th International Conference on Quantitative Infrared Thermography (QIRT), 2014.
Woock, P.; Pak, A.Proceedings of the 2nd Underwater Acoustics Conference 2014, 2014.
Vogelbacher, M.; Ziebarth, M.; Olawsky, S.; Beyerer, J.tm - Technisches Messen 81 no. 12, pp. 644-651, Oldenbourg Wissenschaftsverlag, 2014.
Beyerer, J.; Pak, A. (eds.)Karlsruher Schriften zur Anthropomatik, vol. 17, KIT Scientific Publishing, 2014.
Ziebarth, M.; Heizmann, M.; Beyerer, J.Puente León, F.; Heizmann, M. (eds.), Forum Bildverarbeitung, pp. 153-165, KIT Scientific Publishing, 2014.
Usländer, T.; Pfrommer, J.; Schleipen, M.2014.
Klusch, M.; Meshram, A.; Kapahnke, P.; Schuetze, A.Proceedings of the 29th Annual ACM Symposium on Applied Computing, pp. 308--315, ACM, 2014.
Palm, F.; Grüner, S.; Pfrommer, J.; Graube, M.; Urbas, L.2014.
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Emter, T.Technical report IES-2010-07. In: Beyerer, J.; Huber, M. (eds.), Proceedings of the 2010 Joint Workshop of Fraunhofer IOSB and Institute for Anthropomatics, Vision and Fusion Laboratory, Karlsruher Schriften zur Anthropomatik, vol. 7, pp. 91-106, KIT Scientific Publishing, 2010.
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Bader, T.Technical report IES-2010-09. In: Beyerer, J.; Huber, M. (eds.), Proceedings of the 2010 Joint Workshop of Fraunhofer IOSB and Institute for Anthropomatics, Vision and Fusion Laboratory, Karlsruher Schriften zur Anthropomatik, vol. 7, pp. 121-133, KIT Scientific Publishing, 2010.
Gruna, R.Technical report IES-2010-10. In: Beyerer, J.; Huber, M. (eds.), Proceedings of the 2010 Joint Workshop of Fraunhofer IOSB and Institute for Anthropomatics, Vision and Fusion Laboratory, Karlsruher Schriften zur Anthropomatik, vol. 7, pp. 135-150, KIT Scientific Publishing, 2010.
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Belkin, A.Technical report IES-2010-13. In: Beyerer, J.; Huber, M. (eds.), Proceedings of the 2010 Joint Workshop of Fraunhofer IOSB and Institute for Anthropomatics, Vision and Fusion Laboratory, Karlsruher Schriften zur Anthropomatik, vol. 7, pp. 187-199, KIT Scientific Publishing, 2010.
Höfer, S.Technical report IES-2010-14. In: Beyerer, J.; Huber, M. (eds.), Proceedings of the 2010 Joint Workshop of Fraunhofer IOSB and Institute for Anthropomatics, Vision and Fusion Laboratory, Karlsruher Schriften zur Anthropomatik, vol. 7, pp. 201-212, KIT Scientific Publishing, 2010.
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Moßgraber, J.; Reinert, F.; Vagts, H.Proc. Fifth International Conference on Systems ICONS, pp. 146-151, 2010.
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Bauer, A.; Fischer, Y.Buford, J.; Jakobson, G.; Erickson, J.; Tolone, W.; Ribarsky, W. (eds.), Cyber Security, Situation Management, and Impact Assessment II; and Visual Analytics for Homeland Defense and Security II, Proceedings of SPIE Vol. 7709, 2010.
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Drath, R.; Schleipen, M.Drath, R. (ed.), Datenaustausch in der Anlagenplanung mit AutomationML, pp. 45-94, Springer, 2010.
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Schleipen, M.; Sauer, O.Proceedings of 3rd International Swedish Production Symposium, Day 2 Book, pp. 139-146, 2009.
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Gheta, I.Technical report IES-2009-02. In: Beyerer, J.; Huber, M. (eds.), Proceedings of the 2009 Joint Workshop of Fraunhofer IOSB and Institute for Anthropomatics, Vision and Fusion Laboratory, pp. 17-30, KIT Scientific Publishing, 2009.
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Gruna, R.Technical report IES-2009-05. In: Beyerer, J.; Huber, M. (eds.), Proceedings of the 2009 Joint Workshop of Fraunhofer IOSB and Institute for Anthropomatics, Vision and Fusion Laboratory, pp. 63-77, KIT Scientific Publishing, 2009.
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Emter, T.Technical report IES-2009-07. In: Beyerer, J.; Huber, M. (eds.), Proceedings of the 2009 Joint Workshop of Fraunhofer IOSB and Institute for Anthropomatics, Vision and Fusion Laboratory, pp. 95-110, KIT Scientific Publishing, 2009.
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Heizmann, M.Pattern Recognition and Image Analysis 18 no. 2, pp. 222-230, 2008.
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Bär, T.; Mandel, S.; Sauer, O.; Ebel, M.Sauer, O.; Sutschet, G. (eds.), Tagungsband zum 2. Karlsruher Leittechnischen Kolloquium, pp. 105-121, Fraunhofer IRB Verlag, 2008.
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Eckel, S.; Geisler, J.Special Sessions on Food Safety, Visual Analytics, Resource Restricted Embedded and Sensor Networks, and 3D Imaging and Display, Proceedings of SPIE 6983, 2008.
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Balzer, J.; Dibbelt, J.; Beyerer, J.Puente León, F.; Heizmann, M. (eds.), Bildverarbeitung in der Mess- und Automatisierungstechnik, VDI-Berichte Nr. 1981, pp. 125-136, VDI-Verlag, Düsseldorf, 2007.
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Beyerer, J.; Herzog, R.; Geisler, J.Modeling and Simulation to Address NATO's New and Existing Military Requirements, 2004.
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Beyerer, J.; vom Stein, D.; Klawitter, T.Cast Metal Times, Vol. 5, No. 4, 2003, Modern Media Communications, Shoreham by Sea, pp. 58-60, 2003.
Beyerer, J.; vom Stein, D.; Klawitter, T.Hommes & Fonderie, Nr. 333, Paris, pp. 30-34, 2003.
Heizmann, M.Sensoren und Meßsysteme 2002, Vorträge der 11. ITG/GMA Fachtagung, VDE-Verlag, Berlin, pp. 375-378, 2002.
Heizmann, M.Investigative Image Processing II, Z.J. Geradts, L.I. Rudin (eds.), Processings of SPIE, Vol. 4709, pp. 68-79, 2002.
Heizmann, M.Investigative Image Processing II, Z.J. Geradts, L.I. Rudin (eds.), Processings of SPIE, Vol. 4709, pp. 80-91, 2002.
Beyerer, J.; Puente León, F.at - Automatisierungstechnik 50, Nr. 10, pp. 472-480, 2002.
Beyerer, J.Tagungsband "Berichte aus Wissenschaft und Praxis" zu den 4. Formstoff-Tagen, Duisburg, 2002.
Beyerer, J.Giesserei-Erfahrungsaustausch, Verlag Erfahrungsaustausch Heddesheim, Heft 8/2002, pp. 350-354, 2002.
Beyerer, J.Cast Metal Time 3 no. 6, pp. 30-33, Modern Media Communications, 2001.
Heizmann, M.; Puente León, F.Enabling Technologies for Law Enforcement and Security, S.K. Bramble, E.M. Carapezza, and L.I. Rudin (eds.), Proceedings of SPIE, Vol. 4232, pp. 533-544, 2001.
Heizmann, M.; Puente León, F.Proceedings of the Fourth European Meeting for Shoeprint/Toolmark Examiners (SPTM 2001), H. Katterwe, A. Körschgen (eds.), pp. 121-132, 2001.
Puente León, F.; Heizmann, M.Intelligent Robots and Computer Vision XX: Algorithms, Techniques, and Active Vision, D.P. Casasent (ed.), Proceedings of SPIE, Vol. 4572, pp. 513-524, 2001.
Beyerer, J.Gießerei-Praxis, Fachverlag Schiele & Schön Berlin, Heft 11, pp. 454-456, 2001.
Beyerer, J.; Krahe, D.; Puente León, F.Metrology and Properties of Engineering Surfaces, Kapitel 7. Hrsg.: E. Mainsah, J.A. Greenwood, D.G. Chetwynd, Kluwer Academic Publishers, Boston, pp. 243-281, 2001.
Beyerer, J.Cast Metal Times, Vol. 3, No. 6, October/November 2001, Modern Media Communications, Shoreham by Sea, pp. 30-33, 2001.
Beyerer, J.; Seiraffi, M.Hommes & Fonderie, Nr. 314, Paris, pp. 44-55, 2001.
Müller, G.; Seiraffi, M.; Beyerer, J.Automative Casting Processes and Materials, Tagungsband zum SAE 2001 World Congress in Detroit, Society of Automotive Engineers Inc., Warrendale, pp. 99-110, 2001.
Mesch, F.; Beyerer, J.Measurement Science - A Discussion, Hrsg.: Kariya, K. und Finkelstein, L., Omsha, Ltd., Tokyo, pp. 149-167, 2000.
Beyerer, J.; Seiraffi, M.Hommes & Fonderie, Nr. 306, Paris, pp. 23-31, 2000.
Beyerer, J.VDI Berichte 1572: Bildverarbeitung im industriellen Einsatz, VDI Verlag, Düsseldorf, pp. 95-100, 2000.
Beyerer, J.; Seiraffi, M.Gießerei-Praxis, Fachverlag Schiele & Schön Berlin, Heft 6, pp. 245-254, 2000.
Beyerer, J.; Mesch, F.Proceedings of the International Workshop on Advances of Measurement Sciences, IMEKO, SICE, Kyoto, Japan, June, pp. 209-227, 1999.
Beyerer, J.; Karrais, A.; Schön, W.-U.Giesserei 86, Nr. 9, pp. 116-118, 1999.
Beyerer, J.VDI Fortschritt-Berichte, Reihe 8, Nr. 783, VDI Verlag, Düsseldorf, 1999.
Puente León, F.; Beyerer, J.SPIE's Internat. Symposium on Intelligent Systems & Advanced Manufacturing, Boston, 1999.
Beyerer, J.; Seiraffi, M.; Winkel, T.Proceedings of the CONAF 99, Sao Paulo, Brasilien, 1999.
Beyerer, J.Measurement - Journal of the IMEKO, Elsevier, Vol. 25, No. 1, pp. 1-7, 1999.
Krahe, D.; Beyerer, J.ITG-Fachtagung, Sensoren und Meßtechnik, Bad Nauheim, 9.-11. März, pp. 512-528, 1998.
Beyerer, J.; Puente León, F.Optical Engineering, Vol. 37, No. 10, pp. 2733-2741, 1998.
Beyerer, J.; Krahe, D.Tagungsband zur WTA '98 Workshop on Texture Analysis, Hrsg.: H. Burkhard, Freiburg, 1998.
Beyerer, J.Signal Processing, Elsevier, Vol. 68, Nr. 1, pp. 107-111, 1998.
Beyerer, J.; Puente León, F.Optical Engineering, Vol. 36, No. 1, pp. 85-93, 1997.
Puente León, F.; Beyerer, J.at - Automatisierungstechnik, Oldenbourg, Vol. 45, Nr. 10, pp. 480-489, 1997.
Beyerer, J.; Pérard, D.tm - Technisches Messen 64, Oldenbourg, Nr. 10, pp. 394-400, 1997.
Beyerer, J.; Trächtler, A.tm - Technisches Messen 64, Oldenbourg, Nr. 10, pp. 401-407, 1997.
Puente León, F.; Beyerer, J.Proc. of SPIE, Vol. 3208, Intelligent Robots and Computer Vision XVI, Pittsburgh, pp. 394-405, 1997.
Armbruster, K.; Beyerer, J.; Bröcher, B.; Föhr, R.; Friedrich, A.; Neddermeyer, W.atp - Automatisierungstechnische Praxis 39 (1997) 4, R.Oldenbourg Verlag München, pp. 22-33, 1997.
Krahe, D.; Beyerer, J.Proceedings of SPIE, Vol. 3203, Architectures, Networks, and Intelligent Systems for Manufacturing Integration, Pittsburgh, pp. 192-201, 1997.
Pérard, D.; Beyerer, J.Proceedings of SPIE, Vol. 3204, Three-Dimensional Imaging and Laser-based Systems for Metrology and Inspection III, Pittsburgh, pp. 75-80, 1997.
Puente León, F.; Beyerer, J.BKA-Symposium der AG Schußwaffen/Ballistik Wenningen, 1997.
Beyerer, J.XIV IMEKO World Congress, Vol. 5, Tampere, Finnland, pp. 95-100, 1997.
Beyerer, J.; Krahe, D.Tagungsband der 7th International Conference on Metrology and Properties of Engineering Surfaces, Göteborg, Schweden, pp. 396-403, 1997.
Beyerer, J.; Puente Léon, F.Tagungsband zum IPK-Workshop: Bildauswertung für Handel, Banken und Behörden, Methoden - Systeme - Anwendungen, Berlin 19.-20. Feb., pp. 12-16, 1997.
Beyerer, J.; Puente Léon, F.International Journal of Machine Tools & Manufacture, Pergamon, Vol. 37, No. 3, pp. 371-389, 1997.
Beyerer, J.; Puente-León, F.IPR Workshop und Ausstellung für Handel, Banken und Behördern, pp. 1-5, 1997.
Beyerer, J.Measurement - Journal of the IMEKO, Elsevier, Vol. 18, No. 4, pp. 225-235, 1996.
Bucourt, S.; Beyerer, J.; Ulmer, G.; Sirat, G.Vision Systems: Applications, Panayotis, K.A.; Nickolay, B. (editors), SPIE Vol. 2786, pp. 139-145, 1996.
Beyerer, J.tm - Technisches Messen 63 no. 5, pp. 182-190, Oldenbourg, 1996.
Beyerer, J.Tagungsband der 3. Fachtagung Honen, Vulkan-Verlag, Essen, pp. 9.1-9.17, 1995.
Beyerer, J.; Puente León, F.Symposium Schußwaffen/Schußwaffenspuren, Ludwigshafen, 1995.
Beyerer, J.Measurement - Journal of the IMEKO, Elsevier, Vol. 15, No. 3, pp. 189-199, 1995.
Beyerer, J.; Greiner, T.GMA-Aussprachetag Meßsignalverarbeitung und Diagnose, 21./22.03.1995 in Langen, GMA-Bericht 24, pp. 165-174, 1995.
Beyerer, J.VIII. Meßtechnisches Symposium, Berlin, pp. 77-93, 1994.
Beyerer, J.Dissertation, VDI-Fortschritt-Berichte, Reihe 8, Nr. 390, VDI Verlag, Düsseldorf, 1994.
Beyerer, J.tm - Technisches Messen 60, Nr. 11, pp. 419-424, 1993.
Beyerer, J.State and Advances of Measurement and Instrumentation Science, hrsg. von L. Finkelstein und K.T.V. Grattan, City University Press, London, pp. 360-369, 1993.
Beyerer, J.tm - Technisches Messen 59, Nr. 10, pp. 389-397, 1992.
Beyerer, J.36. Internationales Wissenschaftliches Kolloquium, Ilmenau, pp. 433-438, 1991.
Beyerer, J.25. Regelungstechnisches Kolloquium, 1991.
Beyerer, J.Chip-Special 4/81: Bauanleitung für Mikrocomputer, Vogel-Verlag Würzburg, pp. 84-85, 1981.