Technical report IES-2009-05. In: Jürgen Beyerer, Marco Huber (eds.), Proceedings of the 2009 Joint Workshop of Fraunhofer IOSB and Institute for Anthropomatics, Vision and Fusion Laboratory, KIT Scientific Publishing, 2009.
In many machine vision applications for automated inspection the illumination design is crucial to the robustness and speed of the inspection process. Therefore, there is need to investigate and experimentally evaluate new illumination designs and techniques. We briefly review a representative selection of illumination techniques that aim to minimize the effort of defect detection by adapting the illuminating light field to the nominal state of the inspection task. Based on this principle we propose an illumination technique using a projector-camera system which provides inspection images that directly display differences in reflectance between two scenes.