Home | deutsch  | Legals | Data Protection | Sitemap | KIT
Linear Deflectometry – Regularization and Experimental Design

Journal paper

Links:
Authors:

Jonathan Balzer
Stefan Werling
Jürgen Beyerer

Source:

tm - Technisches Messen 78 no. 1, Oldenbourg Wissenschaftsverlag, January 2011.

Pages:

43-50

Specular surfaces can be measured with deflectometric methods. The solutions form a one-parameter family whose properties are discussed in this paper. We show in theory and experiment that the shape sensitivity of solutions decreases with growing distance from the optical center of the imaging component of the sensor system and propose a novel regularization strategy. Recommendations for the construction of a measurement setup aim for benefiting this strategy as well as the contrarian standard approach of regularization by specular stereo.