Home | deutsch  | Legals | Data Protection | Sitemap | KIT
Speed-up Chromatic Sensors by Optimized Optical Filters

Conference paper

Links:
Authors:

Miro Taphanel
Bastiaan Hovestreydt
Jürgen Beyerer

Source:

Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 2013.

Pages:

87880S–87880S-10

Conference:

Optical Measurement Systems for Industrial Inspection VIII, Munich,Germany , May 13 - 16, 2013