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Multiplex acquisition approach for high speed 3D measurements with a chromatic confocal microscope

Conference paper

Links:
Authors:

Miro Taphanel
Ralf Zink
Thomas Längle
Jürgen Beyerer

Source:

SPIE 9525, Optical Measurement Systems for Industrial Inspection IX, 2015.

Pages:

95250Y-95250Y

Conference:

Optical Metrology, München, Deutschland, June 21 - 25, 2015