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Journal Papers
TitleAuthorsSource
Krempel, E.; Birnstill, P.; Beyerer, J.European Journal for Security Research online first, Springer, 2017.
Retzlaff, M.-G.; Hanika, J.; Beyerer, J.; Dachsbacher, C.Journal of Sensors and Sensor Systems 6 no. 1, pp. 171-184, 2017.
Jarvis, J.; Haertelt, M.; Hugger, S.; Butschek, L.; Fuchs, F.; Ostendorf, R.; Wagner, J.; Beyerer, J.Advanced Optical Technologies 6 no. 2, pp. 85--93, 2017.
Luo, D.; Taphanel, M.; Längle, T.; Beyerer, J.Applied Optics 56 no. 8, pp. 2155-3165, OSA, 2017.
Beyerer, J.; Usländer, T.at - Automatisierungstechnik 64 no. 9, pp. 697-698, De Gruyter, 2016.
Azaiez, S.; Boc, M.; Loic Cudennec, .; Simoes, M. D. S.; Haupert, J.; Kchir, S.; Klinge, X.; Labidi, W.; Nahhal, K.; Pfrommer, J.; Schleipen, M.; Schulz, C.; Tortech, T.Procedia Computer Science 83, pp. 1268-1273, Elsevier, 2016.
Meyer, J.; Längle, T.; Beyerer, J.tm - Technisches Messen 83 no. 12, pp. 731-738, De Gruyter, 2016.
Grüner, S.; Pfrommer, J.; Palm, F.IEEE Transactions on Industrial Informatics 12 no. 5, pp. 1832-1841, IEEE, 2016.
Beyerer, J.; Geisler, J.European Journal of Security Research 1 no. 2, pp. 135-150, Springer, 2016.
Kuwertz, A.; Beyerer, J.Journal of Applied Logic 19 no. 2, pp. 102-127, Elsevier, 2016.
Pfrommer, J.; Grüner, S.; Goldschmidt, T.; Schulz, D.at-Automatisierungstechnik 64 no. 9, pp. 729-741, De Gruyter, 2016.
Meyer, J.; Gruna, R.; Längle, T.; Beyerer, J.Electronic Imaging 2016 no. 19, pp. 1-9, 2016.
Luo, D.; Bauer, S.; Taphanel, M.; Längle, T.; León, F. P.; Beyerer, J.Proceedings of SPIE Next-Generation Spec, pp. 98550P-98550P-9, SPIE, 2016.
Taphanel, M.; Beyerer, J.tm Technisches Messen 82 no. 2, pp. 94-101, Oldenbourg Wissenschaftsverlag, 2015.
Dunau, P.; Fitz, D.; Beyerer, J.tm Technisches Messen 82 no. 5, pp. 262-272, Oldenbourg Wissenschaftsverlag, 2015.
Retzlaff, M.-G.; Stabenow, J.; Beyerer, J.; Dachsbacher, C.tm Technisches Messen 82 no. 3, pp. 251-261, Oldenbourg Wissenschaftsverlag, 2015.
Richter, M.; Längle, T.; Beyerer, J.tm Technisches Messen 82 no. 2, pp. 663-671, Oldenbourg Wissenschaftsverlag, 2015.
Rauschenbach, T.; Beyerer, J.at-Automatisierungstechnik 63 no. 5, pp. 232-324, Oldenbourg Wissenschaftsverlag, 2015.
Qu, C.; Gao, H.; Ekenel, H. K.EURASIP Journal on Image and Video Processing 2015 no. 1, pp. 1-12, Springer, 2015.
Sommer, L. W.; Raghavan, A.; Kiesel, P.; Saha, B.; Schwartz, J.; Lochbaum, A.; Ganguli, A.; Bae, C.-J.; Alamgir, M.Journal of The Electrochemical Society 162 no. 14, pp. A2664--A2669, The Electrochemical Society, 2015.
Sommer, L. W.; Kiesel, P.; Ganguli, A.; Lochbaum, A.; Saha, B.; Schwartz, J.; Bae, C.-J.; Alamgir, M.; Raghavan, A.Journal of Power Sources 296, pp. 46--52, Elsevier, 2015.
Beyerer, J.; Jasperneite, J.; Sauer, O.at Automatisierungstechnik 10 no. 63, pp. 751-752, De Gruyter, 2015.
Pfrommer, J.; Stogl, D.; Aleksandrov, K.; Navarro, S. E.; Hein, B.; Beyerer, J.at Automatisierungstechnik 10 no. 63, De Gruyter, 2015.
Woock, P.; Stephan, T.; Beyerer, J.at - Automatisierungstechnik 63 no. 5, pp. 334-343, Oldenbourg Wissenschaftsverlag, 2015.
Richter, M.; Längle, T.; Beyerer, J.tm -Technisches Messen 82 no. 3, pp. 135-144, 2015.
Kühnert, C.; Beyerer, J.Machines 2014 2 no. 4, pp. 255-274, 2014.
Vogelbacher, M.; Ziebarth, M.; Olawsky, S.; Beyerer, J.tm - Technisches Messen 81 no. 12, pp. 644-651, Oldenbourg Wissenschaftsverlag, 2014.
Pfrommer, J.; Warrington, J.; Schildbach, G.; Morari, M.IEEE Transactions on Intelligent Transportation Systems 15 no. 4, pp. 1567 - 1578, IEEE, 2014.
Roschani, M.; Beyerer, J.tm Technisches Messen 80 no. 6, pp. 189-195, Oldenbourg Wissenschaftsverlag, 2013.
Stephan, T.; Heizmann, M.tm -Technisches Messen 80 no. 10, pp. 312-320, 2013.
Beyerer, J.; Peinsipp-Byma, E.; Stiefelhagen, R.at Automatisierungstechnik, pp. 727-728, Oldenbourg Wissenschaftsverlag, 2013.
Fischer, Y.; Beyerer, J.International Journal on Advances in Systems and Measurement 6 no. 3&4, pp. 245-259, IARIA, 2013.
Pfrommer, J.; Schleipen, M.; Beyerer, J.atp edition 55 no. 11, pp. 42-49, Deutscher Industrieverlag, 2013.
Grafmüller, M.; Beyerer, J.Expert Systems with Applications 40 no. 17, pp. 6955-6963, Elsevier, 2013.
Ziebarth, M.; Le, T.-T.; Greiner, T.; Heizmann, M.Photonik, pp. 46-48, AT-Fachverlag, 2013.
Puente-Leon, F.; Beyerer, J.tm Technisches Messen 79 no. 4, Oldenbourg Wissenschaftsverlag, 2012.
Beyerer, J.; Heizmann, M.; Kuntze, H.-B.Automatisierungstechnik 60 no. 5, pp. 243-245, Oldenbourg Wissenschaftsverlag, 2012.
Taphanel, M.; Gruna, R.; Beyerer, J.tm - Technisches Messen 79 no. 4, pp. 202-209, Oldenbourg Wissenschaftsverlag, 2012.
Calliess, J.; Mai, M.; Pfeiffer, S.Multidimensional Systems and Signal Processing 23 no. 1-2, pp. 255-279, Springer, 2012.
Sauer, O.; Schleipen, M.IT & Production no. 4, pp. 14-16, 2011.
Frese, C.; Beyerer, J.ATZ Elektronik Worldwide no. 5/2011, pp. 48-52, Springer, 2011.
Frese, C.; Beyerer, J.Automobiltechnische Zeitschrift ATZ Elektronik 6 no. 5, pp. 70-75, Springer, 2011.
Puente León, F.; Beyerer, J.Information Fusion 12 no. 4, pp. 242-243, Elsevier, 2011.
Werling, S.; Beyerer, J.tm - Technisches Messen 78 no. 9, pp. 398-404, Oldenbourg Wissenschaftsverlag, 2011.
Gheţa, I.; Höfer, S.; Heizmann, M.; Beyerer, J.tm - Technisches Messen 78 no. 9, pp. 391-397, Oldenbourg Wissenschaftsverlag, 2011.
Michelsburg, M.; Gruna, R.; Vieth, K.-U.; Puente León, F.tm - Technisches Messen 78 no. 9, pp. 384-390, Oldenbourg Wissenschaftsverlag, 2011.
Beyerer, J.; Sauer, O.at - Automatisierungstechnik 59 no. 7, pp. 395-396, Oldenbourg Wissenschaftsverlag, 2011.
Schleipen, M.; Münnemann, A.; Sauer, O.at - Automatisierungstechnik 59 no. 7, pp. 413-424, Oldenbourg Wissenschaftsverlag, 2011.
Schleipen, M.; Okon, M.; Wie, J.; Hövelmeyer, T.Productivity Management 16 no. 2, pp. 23-25, GITO-Verlag, 2011.
Muley, S.; Bastikar, V.; Bothe, S.; Meshram, A.; Roy, N.Journal of Biophysics and Structural Biology 3 no. 1, pp. 24--29, Academic Journals, 2011.
Balzer, J.; Werling, S.; Beyerer, J.tm - Technisches Messen 78 no. 1, pp. 43-50, Oldenbourg Wissenschaftsverlag, 2011.
Balzer, J.; Werling, S.Measurement 43 no. 10, pp. 1305-1317, Elsevier, 2010.
Werling, S.; Heizmann, M.IndustrialVision no. 4, pp. 42-43, Vereinigte Fachverlage, 2010.
Kuwertz, A.; Huber, M. F.; Sawo, F.; Hanebeck, U. D.tm - Technisches Messen 77 no. 10, pp. 551-557, Oldenbourg Wissenschaftsverlag, 2010.
Heizmann, M.; Gheta, I.; Puente León, F.; Beyerer, J.tm - Technisches Messen 77 no. 10, pp. 558-567, Oldenbourg Wissenschaftsverlag, 2010.
Sommer, K.-D.; Puente León, F.; Heizmann, M.tm - Technisches Messen 77 no. 10, pp. 507-508, Oldenbourg Wissenschaftsverlag, 2010.
Beyerer, J.; Tacke, M.Strategie & Technik 52 no. 2, pp. 70-71, Report-Verlag, 2010.
Werling, S.; Mai, M.; Heizmann, M.; Beyerer, J.Metrology and Measurement Systems XVI no. 3, pp. 415-431, Polish Academy of Science, 2009.
Werling, S.; Mai, M.; Heizmann, M.; Beyerer, J.Metrology and Measurement Systems 16 no. 3, pp. 415-431, Polish Academy of Sciences, 2009.
Heizmann, M.; Beyerer, J.; Puente León, F.QZ Qualität und Zuverlässigkeit 54 no. 6, pp. 35-39, 2009.
Tandler, J.; Zimmerman, E.; Muntean, V.; Melz, T.; Seipel, B.; Koch, T.; Willersinn, D.; Grinberg, M.Vision Zero, pp. 134-139, UKIP, 2009.
Sander, J.; Beyerer, J.Robotics and Autonomous Systems 57 no. 3, pp. 259-267, Elsevier, 2009.
Fay, A.; Schleipen, M.; Mühlhause, M.atp - Automatisierungstechnische Praxis no. 1, pp. 80-85, 2009.
Tandler, J.; Zimmerman, E.; Muntean, V.; Seipel, B.; Koch, T.; Willersinn, D.; Grinberg, M.; Mayer, C.; Diez, M.International Journal of Crashworthiness 13 no. 6, pp. 679-692, Taylor & Francis, 2008.
Frese, C.; Batz, T.; Beyerer, J.at - Automatisierungstechnik 56 no. 12, pp. 644-652, Oldenbourg Wissenschaftsverlag, 2008.
Lellmann, J.; Balzer, J.; Rieder, A.; Beyerer, J.International Journal of Computer Vision 80 no. 2, pp. 226-241, 2008.
Kammel, S.; Ziegler, J.; Pitzer, B.; Werling, M.; Gindele, T.; Jagszent, D.; Schröder, J.; Thuy, M.; Goebl, M.; von Hundelshausen, F.; Pink, O.; Frese, C.; Stiller, C.Journal of Field Robotics 25 no. 9, pp. 615-639, 2008.
Gheta, I.; Heizmann, M.; Beyerer, J.tm - Technisches Messen 75 no. 7-8, pp. 445-454, Oldenbourg Wissenschaftsverlag, 2008.
Bader, T.tm - Technisches Messen 75 no. 7-8, pp. 429-436, Oldenbourg Wissenschaftsverlag, 2008.
Puente León, F.; Heizmann, M.tm - Technisches Messen 75 no. 7-8, pp. 425-428, Oldenbourg Wissenschaftsverlag, 2008.
Puente León, F.; Heizmann, M. (eds.)Sonderhefte, tm - Technisches Messen 75 no. 7-8, 10, Oldenbourg Wissenschaftsverlag, 2008.
Heizmann, M.Pattern Recognition and Image Analysis 18 no. 2, pp. 222-230, 2008.
Ebel, M.; Drath, R.; Sauer, O.atp - Automatisierungstechnische Praxis 50 no. 5, pp. 40-47, Oldenbourg Industrieverlag, 2008.
Beyerer, J.Strategie & Technik, pp. 102-105, Report-Verlag, 2008.
Sauer, O.; Ebel, M.PPS Management 12 Nr. 4, pp. 24-27, 2007.
Balzer, J.; Werling, S.; Beyerer, J.tm-Technisches Messen 74 Nr. 11, Oldenbourg Verlag, München, pp. 545-552, 2007.
Beyerer, J.Technology Review, pp. 72-73, Heise Zeitschriftenverlag, 2007.
Werling, S.; Beyerer, J.tm Technisches Messen 74 Nr. 4, Oldenbourg Verlag, München, pp. 217-223, 2007.
Peinsipp-Byma, E.; Eck, R.; Bader, T.; Geisler, J.MMI-interaktiv Journal Nr. 12, 2007.
Beyerer, J.; Sander, J.; Werling, S.tm Technisches Messen 74 Nr. 3, Oldenbourg Verlag, München, pp. 103-111, 2007.
Heizmann, M.; Puente León, F.tm Technisches Messen 74 (2007) Nr. 3, Oldenbourg Verlag, München, pp. 130-138, 2007.
Beyerer, J.; Geisler, J.Strategie und Technik Nr. 2, Report-Verlag, Bonn, pp. 10-12, 2007.
Heizmann, M.IEEE Transactions on Image Processing Vol. 15 No. 3, pp. 624-631, 2006.
Beyerer, J.Gießerei 92, 12 / 2005, Düsseldorf, pp. 54-55, 2005.
Puente León, F.; Beyerer, J.tm Technisches Messen 72 (2005) 12, Oldenbourg Verlag, München, pp. 663-670, 2005.
Beyerer, J.; Puente León, F.at - Automatisierungstechnik 53 (10/2005), Oldenbourg Verlag, München, pp. 493-502, 2005.
Beyerer, J.IuK-News, 03/2005, Fraunhofer Gruppe Informations- und Kommunikationstechnik, Berlin 2005. ISSN 18608264, pp. 3-4, 2005.
Beyerer, J.Fraunhofer Magazin 4.2004, München, pp. 46-47, 2004.
Xin, B.; Heizmann, M.; Kammel, S.; Stiller, C.tm - Technisches Messen 71, Nr. 4, pp. 218-226, 2004.
Beyerer, J.; Bierweiler, T.; vom Stein, D.; Klawitter, T.Casting Plant and Technology International 19 Nr. 4, pp. 24-35, 2003.
Heizmann, M.; Puente León, F.Optical Engineering 42 (12), pp. 3423-3432, 2003.
Beyerer, J.; vom Stein, D.Foundry Trade Journal, Vol. 177, No. 3610, DMG World Media (uk) ltd, Redhill, Surrey, pp. 12-14, 2003.
Beyerer, J.; Bierweiler, T.; vom Stein, D.; Klawitter, T.Giesserei - Die Zeitschrift der Deutschen Giessereivereinigungen, 90. Jahrgang, Nr. 7, VDG Verein Deutscher Gießereifachleute e. V., Düsseldorf, pp. 26-31, 2003.
Beyerer, J.; vom Stein, D.; Klawitter, T.Giesserei-Erfahrungsaustausch, 47. Jahrgang, Nr. 7, Verlag Erfahrungsaustausch GmbH, Heddesheim, pp. 283-286, 2003.
Beyerer, J.; vom Stein, D.; Klawitter, T.Cast Metal Times, Vol. 5, No. 4, 2003, Modern Media Communications, Shoreham by Sea, pp. 58-60, 2003.
Beyerer, J.; vom Stein, D.; Klawitter, T.Hommes & Fonderie, Nr. 333, Paris, pp. 30-34, 2003.
Beyerer, J.; Puente León, F.at - Automatisierungstechnik 50, Nr. 10, pp. 472-480, 2002.
Beyerer, J.Giesserei-Erfahrungsaustausch, Verlag Erfahrungsaustausch Heddesheim, Heft 8/2002, pp. 350-354, 2002.
Beyerer, J.Cast Metal Time 3 no. 6, pp. 30-33, Modern Media Communications, 2001.
Beyerer, J.Gießerei-Praxis, Fachverlag Schiele & Schön Berlin, Heft 11, pp. 454-456, 2001.
Beyerer, J.Cast Metal Times, Vol. 3, No. 6, October/November 2001, Modern Media Communications, Shoreham by Sea, pp. 30-33, 2001.
Beyerer, J.; Seiraffi, M.Hommes & Fonderie, Nr. 314, Paris, pp. 44-55, 2001.
Beyerer, J.; Seiraffi, M.Hommes & Fonderie, Nr. 306, Paris, pp. 23-31, 2000.
Beyerer, J.; Seiraffi, M.Gießerei-Praxis, Fachverlag Schiele & Schön Berlin, Heft 6, pp. 245-254, 2000.
Beyerer, J.; Karrais, A.; Schön, W.-U.Giesserei 86, Nr. 9, pp. 116-118, 1999.
Beyerer, J.Measurement - Journal of the IMEKO, Elsevier, Vol. 25, No. 1, pp. 1-7, 1999.
Beyerer, J.; Puente León, F.Optical Engineering, Vol. 37, No. 10, pp. 2733-2741, 1998.
Beyerer, J.Signal Processing, Elsevier, Vol. 68, Nr. 1, pp. 107-111, 1998.
Beyerer, J.; Puente León, F.Optical Engineering, Vol. 36, No. 1, pp. 85-93, 1997.
Puente León, F.; Beyerer, J.at - Automatisierungstechnik, Oldenbourg, Vol. 45, Nr. 10, pp. 480-489, 1997.
Beyerer, J.; Pérard, D.tm - Technisches Messen 64, Oldenbourg, Nr. 10, pp. 394-400, 1997.
Beyerer, J.; Trächtler, A.tm - Technisches Messen 64, Oldenbourg, Nr. 10, pp. 401-407, 1997.
Armbruster, K.; Beyerer, J.; Bröcher, B.; Föhr, R.; Friedrich, A.; Neddermeyer, W.atp - Automatisierungstechnische Praxis 39 (1997) 4, R.Oldenbourg Verlag München, pp. 22-33, 1997.
Beyerer, J.; Puente Léon, F.International Journal of Machine Tools & Manufacture, Pergamon, Vol. 37, No. 3, pp. 371-389, 1997.
Beyerer, J.Measurement - Journal of the IMEKO, Elsevier, Vol. 18, No. 4, pp. 225-235, 1996.
Beyerer, J.tm - Technisches Messen 63 no. 5, pp. 182-190, Oldenbourg, 1996.
Beyerer, J.Measurement - Journal of the IMEKO, Elsevier, Vol. 15, No. 3, pp. 189-199, 1995.
Beyerer, J.tm - Technisches Messen 60, Nr. 11, pp. 419-424, 1993.
Beyerer, J.tm - Technisches Messen 59, Nr. 10, pp. 389-397, 1992.
Beyerer, J.Chip-Special 4/81: Bauanleitung für Mikrocomputer, Vogel-Verlag Würzburg, pp. 84-85, 1981.