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Publications

1996
TitleAuthorsSource
Beyerer, J.Measurement - Journal of the IMEKO, Elsevier, Vol. 18, No. 4, pp. 225-235, 1996.
Bucourt, S.; Beyerer, J.; Ulmer, G.; Sirat, G.Vision Systems: Applications, Panayotis, K.A.; Nickolay, B. (editors), SPIE Vol. 2786, pp. 139-145, 1996.
Beyerer, J.tm - Technisches Messen 63 no. 5, pp. 182-190, Oldenbourg, 1996.