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Speed-up Chromatic Sensors by Optimized Optical Filters

Konferenzbeitrag

Links:
Autoren:

Miro Taphanel
Bastiaan Hovestreydt
Jürgen Beyerer

Quelle:

Proc. SPIE 8788, Optical Measurement Systems for Industrial Inspection VIII, 2013.

Seiten:

87880S–87880S-10

Konferenz:

Optical Measurement Systems for Industrial Inspection VIII, Munich,Germany , 13.-16. Mai 2013