Home | english  | Impressum | Sitemap | KIT
Proceedings of SPIE 0277-786X, Volume 8791. Videometrics, Range Imaging, and Applications XII; and Automated Visual Inspection

Tagungsband

Links:
Herausgeber:

Fabio Remondino
Mark Shortis
Jürgen Beyerer
Fernando Puente León

Quelle:

SPIE Optical Metrology, 2016.

Konferenz:

Videometrics, Range Imaging, and Applications XII; and Automated Visual Inspection, Munich, Germany, 14.-16. Mai 2016