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Towards many-class classification of materials based on their spectral fingerprints

Konferenzbeitrag

Links:
Autoren:

Matthias Richter
Jürgen Beyerer

Quelle:

Jürgen Beyerer, Fernando Puente León, Thomas Längle (Hrsg.), OCM 2015 - Optical Characterization of Materials - conference proceedings , KIT Scientific Publishing, 2015.

Seiten:

103-112

Konferenz:

2nd International Conference on Optical Characterization of Materials, Karlsruhe, 18.-19. März 2015