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About the Acquisition and Processing of Ray Deflection Histograms for Transparent Object Inspection

Konferenzbeitrag

Links:
Autoren:

Johannes Meyer
Thomas Längle
Jürgen Beyerer

Quelle:

Irish Machine Vision & Image Processing Conference Proceedings 2016, 2016.

Seiten:

9-16

Konferenz:

Irish Machine Vision & Image Processing Conference 2016, Galway, Ireland, August 2016