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Three-dimensional measurement of free-form surfaces with a structured-light reflection technique

Konferenzbeitrag

Autoren:

D. Pérard
Jürgen Beyerer

Quelle:

Proceedings of SPIE, Vol. 3204, Three-Dimensional Imaging and Laser-based Systems for Metrology and Inspection III, Pittsburgh, 1997.

Seiten:

75-80