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Inspection of honed surfaces by conoscopic and image processing methods

Konferenzbeitrag

Links:
Autoren:

S. Bucourt
Jürgen Beyerer
G. Ulmer
G. Sirat

Quelle:

Vision Systems: Applications, Panayotis, K.A.; Nickolay, B. (editors), SPIE Vol. 2786, 1996.

Seiten:

139-145

Konferenz:

European Symposium on Laser, Optics and Vision for Productivity in Manufacturing II, Besançon, 10.-14. Juni 1996