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Veröffentlichungen

1999
TitelAutorenQuelle
Beyerer, J.; Mesch, F.Proceedings of the International Workshop on Advances of Measurement Sciences, IMEKO, SICE, Kyoto, Japan, June, S. 209-227, 1999.
Beyerer, J.; Karrais, A.; Schön, W.-U.Giesserei 86, Nr. 9, S. 116-118, 1999.
Beyerer, J.VDI Fortschritt-Berichte, Reihe 8, Nr. 783, VDI Verlag, Düsseldorf, 1999.
Puente León, F.; Beyerer, J.SPIE's Internat. Symposium on Intelligent Systems & Advanced Manufacturing, Boston, 1999.
Beyerer, J.; Seiraffi, M.; Winkel, T.Proceedings of the CONAF 99, Sao Paulo, Brasilien, 1999.
Beyerer, J.Measurement - Journal of the IMEKO, Elsevier, Vol. 25, No. 1, S. 1-7, 1999.