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Veröffentlichungen

2015
TitelAutorenQuelle
Ruf, M.Technischer Bericht. In: Proceedings of the 2015 Joint Workshop of Fraunhofer IOSB and Institute for Anthropomatics, Vision and Fusion Laboratory, S. 41-69, 2015.
Taphanel, M.; Beyerer, J.tm Technisches Messen 82 Nr. 2, S. 94-101, Oldenbourg Wissenschaftsverlag, 2015.
Dunau, P.; Fitz, D.; Beyerer, J.tm Technisches Messen 82 Nr. 5, S. 262-272, Oldenbourg Wissenschaftsverlag, 2015.
Retzlaff, M.-G.; Stabenow, J.; Beyerer, J.; Dachsbacher, C.tm Technisches Messen 82 Nr. 3, S. 251-261, Oldenbourg Wissenschaftsverlag, 2015.
Richter, M.; Längle, T.; Beyerer, J.tm Technisches Messen 82 Nr. 2, S. 663-671, Oldenbourg Wissenschaftsverlag, 2015.
Rauschenbach, T.; Beyerer, J.at-Automatisierungstechnik 63 Nr. 5, S. 232-324, Oldenbourg Wissenschaftsverlag, 2015.
Monari, E.; Fischer, Y.; Anneken, M.Proceedings of the 10th Security Research Conference (Future Security), S. 49-56, Fraunhofer Verlag, 2015.
Grasemann, G.; Anneken, M.; Peinsipp-Byma, E.Proceedings of the 10th Security Research Conference (Future Security), S. 325-331, Fraunhofer Verlag, 2015.
Anneken, M.; Teutsch, M.; Brüstle, S.; Unmüßig, G.; Schuchert, T.; Fischer, Y.Proceedings of the NATO Symposium on Information Fusion (Hard and Soft) for Intelligence, Surveillance Reconnaissance (IST-SET-126), 2015.
Anneken, M.; Fischer, Y.; Beyerer, J.Proceedings of 2015 SAI Intelligent Systems Conference (IntelliSys), 2015.
Qu, C.; Gao, H.; Ekenel, H. K.EURASIP Journal on Image and Video Processing 2015 Nr. 1, S. 1-12, Springer, 2015.
Ruf, M.; Ziehn, J.; Willersinn, D.; Rosenhahn, B.; Beyerer, J.; Gotzig, H.Proceedings of the 18th International IEEE Conference on Intelligent Transportation Systems ITSC: Smart Mobility for Safety and Sustainability, S. 1908-1914, IEEE, 2015.
Birnstill, P.; Burkert, C.; Beyerer, J.Proceedings of the 10th Future Security: Security Research Conference, Fraunhofer Verlag, Stuttgart, 2015.
Krempel, E.; Beyerer, J.Proceedings of the 10th Future Security: Security Research Conference, S. 65-72, Fraunhofer Verlag, Stuttgart, 2015.
Pfaff, F.; Baum, M.; Noack, B.; Hanebeck, U. D.; Gruna, R.; Längle, T.; Beyerer, J.Multisensor Fusion and Integration for Intelligent Systems (MFI), 2015 IEEE International Conference on, S. 7--12, 2015.
Jonietz, C.; Monari, E.; Qu, C.Proceedings of the 14th International Conference of the Biometrics Special Interest Group (BIOSIG), S. 1-8, 2015.
Ziehn, J.; Ruf, M.; Rosenhahn, B.; Willersinn, D.; Beyerer, J.; Gotzig, H.10. Workshop Fahrerassistenzsysteme (FAS 2015), S. 71-83, Uni-DAS e.V., Darmstadt , 2015.
Jonietz, C.; Monari, E.; Widak, H.; Qu, C.Proceedings of the 12th IEEE International Conference on Advanced Video and Signal based Surveillance (AVSS) Workshops Karlsruhe, S. 1-6, IEEE, 2015.
Huber, M.Dissertation, Karlsruher Schriften zur Anthropomatik, Bd. 19, KIT Scientific Publishing, Karlsruhe, 2015.
Klusch, M.; Meshram, A.; Schuetze, A.; Helwig, N.Proceedings of the 11th International Conference on Semantic Systems, S. 81--88, 2015.
Sommer, L. W.; Raghavan, A.; Kiesel, P.; Saha, B.; Schwartz, J.; Lochbaum, A.; Ganguli, A.; Bae, C.-J.; Alamgir, M.Journal of The Electrochemical Society 162 Nr. 14, S. A2664--A2669, The Electrochemical Society, 2015.
Sommer, L. W.; Kiesel, P.; Ganguli, A.; Lochbaum, A.; Saha, B.; Schwartz, J.; Bae, C.-J.; Alamgir, M.; Raghavan, A.Journal of Power Sources 296, S. 46--52, Elsevier, 2015.
Beyerer, J.; Jasperneite, J.; Sauer, O.at Automatisierungstechnik 10 Nr. 63, S. 751-752, De Gruyter, 2015.
Meyer, J.Technischer Bericht. In: Proceedings of the 2014 Joint Workshop of Fraunhofer IOSB and Institute for Anthropomatics, Vision and Fusion Laboratory, S. 37-47, KIT Scientific Publishing, Karlsruhe, 2015.
Philipp, P.; Fischer, Y.; Hempel, D.; Beyerer, J.CSCI 2015, International Conference on Computational Science and Computational Intelligence: ISHI 2015, International Symposium on Health Informatics and Medical Systems, december 7-9, Las Vegas, Neva, S. 3-9, 2015.
Philipp, P.; Eck, R.; Peinsipp-Byma, E.GOCICT 2015, Global Online Conference on Information and Computer Technology, november 4-6, 2015.
Philipp, P.; Fischer, Y.; Hempel, D.; Beyerer, J.WorldComp 2015, World Congress in Computer Science, Computer Engineering, and Applied Computing : HIMS 2015, International Conference on Health Informatics and Medical Systems, july 27-30, Las Vegas, , S. 3-9, 2015.
Herrmann, C.; Qu, C.; Beyerer, J.Proceedings of the 4th IEEE International Conference on Signal and Image Processing Applications, 2015, IEEE, 2015.
Herrmann, C.; Qu, C.; Willersinn, D.; Beyerer, J.Proceedings of the 12th IEEE International Conference on Advanced Video and Signal Based Surveillance, IEEE, 2015.
Qu, C.; Monari, E.; Schuchert, T.; Beyerer, J.Proceedings of the 26th British Machine Vision Conference (BMVC), S. 87.1-87.12, BMVA Press, 2015.
Herrmann, C.; Metzler, J.; Willersinn, D.; Beyerer, J.Proceedings of the 10th Future Security, 2015, 2015.
Grüner, S.; Pfrommer, J.; Palm, F.IEEE, (Hrsg.), Factory Communication Systems (WFCS), 2015 IEEE World Conference on, S. 1--4, 2015.
Pfrommer, J.; Stogl, D.; Aleksandrov, K.; Navarro, S. E.; Hein, B.; Beyerer, J.at Automatisierungstechnik 10 Nr. 63, De Gruyter, 2015.
Pfrommer, J.Technischer Bericht. In: Proceedings of the 2014 Joint Workshop of Fraunhofer IOSB and Institute for Anthropomatics, Vision and Fusion Laboratory, S. 77-87, KIT Scientific Publishing, Karlsruhe, 2015.
Frühberger, P.; Stephan, T.; Beyerer, J. 2nd International Multidisciplinary Microscopy and Microanalysis Congress, Springer Proceedings in Physics, Bd. 164, S. 57-64, Springer International Publishing, 2015.
Beyerer, J.; Geisler, J.Beyerer, J.; Meissner, A.; Geisler, J. (Hrsg.), Proceedings of the 10th Future Security, 2015, S. 317-324, Stuttgart: Fraunhofer Verlag, 2015.
Beyerer, J.; Meissner, A.; Geisler, J. (Hrsg.)Fraunhofer Verlag, 2015.
Birnstill, P.; Ren, D.; Beyerer, J.2015 12th IEEE International Conference on Advanced Video and Signal-Based Surveillance (AVSS), S. 1-6, IEEE, 2015.
Beyerer, J.; Pak, A. (Hrsg.)Karlsruher Schriften zur Anthropomatik, Bd. 20, KIT Scientific Publishing, 2015.
Beyerer, J.; León, F. P. (Hrsg.)SPIE, Bellingham, Washington, 2015.
Qu, C.; Gao, H.; Monari, E.; Beyerer, J.; Thiran, J.-P.Proceedings of the 28th IEEE Conference on Computer Vision and Pattern Recognition Workshops (CVPRW), S. 1-9, IEEE, 2015.
Woock, P.; Beyerer, J.Proceedings of the 3rd Underwater Acoustics Conference and Exhibition 2015, 2015.
Qu, C.; Herrmann, C.; Monari, E.; Schuchert, T.; Beyerer, J.Proceedings of the 12th Conference on Computer and Robot Vision (CRV), S. 139-146, IEEE, 2015.
Taphanel, M.; Zink, R.; Längle, T.; Beyerer, J.SPIE 9525, Optical Measurement Systems for Industrial Inspection IX, S. 95250Y-95250Y, 2015.
Herrmann, C.; Beyerer, J.Proceedings of the 12th Conference on Computer Robot Vision (CRV), S. 192-199, 2015.
Ziehn, J.; Ruf, M.; Rosenhahn, B.; Willersinn, D.; Beyerer, J.; Gotzig, H.Proceedings of IEEE Intelligent Vehicles Symposium (IV 2015), S. 380-385, IEEE, 2015.
Janya-Anurak, C.; Bernard, T.; Beyerer, J.Proceedings of the 1st International Conference on Uncertainty Quantification in Computational Sciences and Engineering, S. 702-713, IEEE , 2015.
Richter, M.; Längle, T.; Beyerer, J.Proceedings of the 14th IAPR International Conference on Machine Vision Applications, S. 210-213, 2015.
Woock, P.; Stephan, T.; Beyerer, J.at - Automatisierungstechnik 63 Nr. 5, S. 334-343, Oldenbourg Wissenschaftsverlag, 2015.
Kuwertz, A.; Goldbeck, C.; Hug, R.; Beyerer, J.Proceedings of the UKSIM-AMSS 17th International Conference on Modelling and Simulation (UKSim2015) 2015, S. 165-170, 2015.
Richter, M.; Beyerer, J.Beyerer, J.; León, F. P.; Längle, T. (Hrsg.), OCM 2015 - Optical Characterization of Materials - conference proceedings , S. 103-112, KIT Scientific Publishing, 2015.
Walocha, J.; Richter, M.Beyerer, J.; León, F. P.; Längle, T. (Hrsg.), OCM 2015 - Optical Characterization of Materials - conference proceedings , S. 137-145, KIT Scientific Publishing, 2015.
Beyerer, J.; Puente León, F.; Längle, T. (Hrsg.)Karlsruhe: KIT Scientific Publishing, 2015.
Qu, C.; Monari, E.; Schuchert, T.; Beyerer, J.Proceedings of SPIE 9405, SPIE/IS&T Electronic Imaging 2015, Image Processing: Machine Vision Applications VIII, S. 94050P-94050P-9, 2015.
Herrmann, C.; Beyerer, J.Proc. SPIE 9405, Image Processing: Machine Vision Applications VIII, 940507, 2015.
Richter, M.; Längle, T.; Beyerer, J.tm -Technisches Messen 82 Nr. 3, S. 135-144, 2015.