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Veröffentlichungen

2017
TitelAutorenQuelle
Coluccia, A.; Ghenescu, M.; Piatrik, T.; Cubber, G. D.; Schumann, A.; Sommer, L. W.; Klatte, J.; Schuchert, T.; Beyerer, J.; Farhadi, M.; others,Advanced Video and Signal Based Surveillance (AVSS), 2017 14th IEEE International Conference on, S. 1--6, 2017.
Sommer, L. W.; Schumann, A.; Müller, T.; Schuchert, T.; Beyerer, J.Advanced Video and Signal Based Surveillance (AVSS), 2017 14th IEEE International Conference on, S. 1--6, 2017.
Schumann, A.; Sommer, L. W.; Klatte, J.; Schuchert, T.; Beyerer, J.Advanced Video and Signal Based Surveillance (AVSS), 2017 14th IEEE International Conference on, S. 1--6, 2017.
Sommer, L. W.; Nie, K.; Schumann, A.; Schuchert, T.; Beyerer, J.Advanced Video and Signal Based Surveillance (AVSS), 2017 14th IEEE International Conference on, S. 1--6, 2017.
Sommer, L. W.; Schuchert, T.; Beyerer, J.Applications of Computer Vision (WACV), 2017 IEEE Winter Conference on, S. 311--319, 2017.
Ziebarth, M.; Stephan, T.; Höfer, S.; Burke, J.DGaO-Proceedings 2017, Deutsche Gesellschaft für Angewandte Optik, 2017.
Bhatti, F.; Greiner, T.; Heizmann, M.; Ziebarth, M.Telecommunications and Signal Processing (TSP), 2017 40th International Conference on, S. 559--562, 2017.
Irgenfried, S.; Wörn, H.; Bergmann, S.; Mohammadikaji, M.; Beyerer, J.; Dachsbacher, C.International Conference on Information Systems Architecture and Technology, S. 326--335, 2017.
Irgenfried, S.; Wörn, H.; Bergmann, S.; Mohammadikaji, M.; Beyerer, J.; Dachsbacher, C.at - Automatisierungstechnik 65 Nr. 6, 2017.
Irgenfried, S.; Bergmann, S.; Mohammadikaji, M.; Beyerer, J.; Dachsbacher, C.; Wörn, H.Automated Visual Inspection and Machine Vision II, Bd. 10334, 2017.
Mohammadikaji, M.; Bergmann, S.; Irgenfried, S.; Beyerer, J.; Dachsbacher, C.; Wörn, H.Applications of Computer Vision (WACV), 2017 IEEE Winter Conference on, S. 1008--1016, 2017.
Philipp, P.Technischer Bericht. In: Proceedings of the 2016 Joint Workshop of Fraunhofer IOSB and Institute for Anthropomatics, Vision and Fusion Laboratory, S. 1-16, 2017.
Philipp, P.; Bleier, J.; Fischer, Y.; Beyerer, J.Radermacher, K.; Baena, F. R. Y. (Hrsg.), CAOS 2017. 17th Annual Meeting of the International Societyfor Computer Assisted Orthopaedic Surgery, EPiC Series in Health Sciences, Bd. 1, S. 288--294, 2017.
Philipp, P.; Beyerer, J.; Fischer, Y.Cognitive and Computational Aspects of Situation Management(CogSIMA), 2017 IEEE Conference on, S. 1--7, 2017.
Krempel, E.; Birnstill, P.; Beyerer, J.European Journal for Security Research online first, Springer, 2017.
Retzlaff, M.-G.; Hanika, J.; Beyerer, J.; Dachsbacher, C.Journal of Sensors and Sensor Systems 6 Nr. 1, S. 171-184, 2017.
Jarvis, J.; Haertelt, M.; Hugger, S.; Butschek, L.; Fuchs, F.; Ostendorf, R.; Wagner, J.; Beyerer, J.Advanced Optical Technologies 6 Nr. 2, S. 85--93, 2017.
Herrmann, C.; Willersinn, D.; Beyerer, J.Image Analysis - 20th Scandinavian Conference, SCIA 2017 (Lecture Notes in Computer Science 10269), S. 377-388, Springer, 2017.
Sommer, L. W.; Schuchert, T.; Beyerer, J.Proc. SPIE 10202, Automatic Target Recognition XXVII, 2017.
Hild, J.; Krüger, W.; Brüstle, S.; Trantelle, P.; Unmüßig, G.; Voit, M.; Heinze, N.; Peinsipp-Byma, E.; Beyerer, J.Proc. SPIE 10199, Geospatial Informatics, Fusion, and Motion Video Analytics VII, S. 1019903-1019903-9, 2017.
Maier, S.; Camp, F. v. d.; Hafermann, J.; Wagner, B.; Peinsipp-Byma, E.; Beyerer, J.Proc. SPIE 10190, Ground/Air Multisensor Interoperability, Integration, and Networking for Persistent ISR VIII, S. 101901D-101901D-10, 2017.
Maier, G.; Pfaff, F.; Becker, F.; Pieper, C.; Gruna, R.; Noack, B.; Kruggel-Emden, H.; Längle, T.; Hanebeck, U.; Wirtz, S.; Scherer, V.; Beyerer, J.KIT Scientific Publishing, K. (Hrsg.), Proceedings of the 3rd Conference on Optical Characterization of Materials (OCM 2017), 2017.
Luo, D.; Taphanel, M.; Längle, T.; Beyerer, J.Applied Optics 56 Nr. 8, S. 2155-3165, OSA, 2017.
Qu, C.; Herrmann, C.; Monari, E.; Schuchert, T.; Beyerer, J.Proceedings of the 17th IEEE Winter Conference on Applications of Computer Vision (WACV), S. 1105--1114, IEEE, 2017.
Frühberger, P.; Stephan, T.; Burke, J.; Beyerer, J.Oral, A. Y.; Bahsi Oral, Z. B. (Hrsg.), 3rd International Multidisciplinary Microscopy and Microanalysis Congress (InterM): Proceedings, Oludeniz, Turkey, 19-23 October 2015, S. 223--228, Springer International Publishing, 2017.