Mitarbeiter IES

M.Sc. Ding Luo

Lebenslauf

Ding Luo received his master degree in Optics and Photonics from Karlsruhe Institute of Technology in 2014 and his bachelor degree in Information Engineering from Department of Optical Engineering, Zhejiang University in 2012. Since January 2015, he has joined IES as a scientific staff and has been working towards a PhD degree. He is currently working on adaptive chromatic measurement system.

Veröffentlichungen


2020
Area scanning method for 3D surface profilometry based on an adaptive confocal microscope.
Luo, D.; Taphanel, M.; Claus, D.; Boettcher, T.; Osten, W.; Längle, T.; Beyerer, J.
2020. Optics and lasers in engineering, 124, Art.-Nr.: 105819. doi:10.1016/j.optlaseng.2019.105819
2018
Adaptive Measurement Method for Area Chromatic Confocal Microscopy.
Luo, D.
2018. Proceedings of the 2017 Joint Workshop of Fraunhofer IOSB and Institute for Anthropomatics, Vision and Fusion Laboratory. Ed.: J. Beyerer, 31–43, KIT Scientific Publishing. doi:10.5445/IR/1000085978
2017
RNN-accelerated Experimental Design for Chromatic Confocal Measurement : Technical Report IES-2016-02.
Luo, D.
2017. Proceedings of the 2016 Joint Workshop of Fraunhofer IOSB and Institute for Anthropomatics, Vision an Fusion Laboratory. Ed.: J. Beyerer, 17–29, KIT Scientific Publishing
2016
Ortsaufgelöste optische Bestimmung von Materialanteilen in Mischungen.
Bauer, S.; Krippner, W.; Luo, D.; Taphanel, M.; Abdo, M.; Badilita, V.; Längle, T.; Beyerer, J.; Korvink, J.; Puente León, F.
2016. XXX. Messtechnisches Symposium, Hannover, 15. – 16. September 2016, Hrsg.: S. Zimmermann, 69–76, Oldenbourg Verlag
Optical unmixing using programmable spectral source based on DMD.
Luo, D.; Bauer, S.; Taphanel, M.; Längle, T.; Puente León, F.; Beyerer, J.
2016. Next-Generation Spectroscopic Technologies IX; Baltimore; United States; 18 April 2016 through 19 April 2016, Art. Nr.: 98550P, Society of Photo-optical Instrumentation Engineers (SPIE). doi:10.1117/12.2228303
Capturing ground truth super-resolution data.
Qu, C.; Luo, D.; Monari, E.; Schuchert, T.; Beyerer, J.
2016. IEEE International Conference on Image Processing (ICIP), Phoenix, AZ, USA, 25–28 September 2016, 2812–2816, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICIP.2016.7532872
Compressive shape from focus based on a linear measurement model.
Luo, D.; Längle, T.; Beyerer, J.
2016. Forum Bildverarbeitung 2016. Hrsg.: M. Heizmann, 185–195, KIT Scientific Publishing
Linear Model for Optical Measurement : Technical Report IES-2015-02.
Luo, D.
2016. Proceedings of the 2015 Joint Workshop of Fraunhofer IOSB and Institute for Anthropomatics, Vision and Fusion Laboratory. Ed.: J. Beyerer, 17–29, KIT Scientific Publishing