M.Sc. Chia-wei Chen

  • Karlsruher Institut für Technologie – KIT
    Lehrstuhl für Interaktive Echtzeitsysteme (IES)
    Prof. Dr.- Ing. Jürgen Beyerer
    c/o Technologiefabrik
    Haid-und-Neu-Str. 7
    76131 Karlsruhe

Lebenslauf

Chia-Wei Chen is a scientific staff at Vision and Fusion Laboratory (IES), Karlsruhe Institute of Technology(KIT). He is working on retroreflex ellipsometry inclose collaboration with Vision Based Inspection Systems (SPR) at Fraunhofer Institute of Optronics, System Technologies and Image Exploitation IOSB in arlsruhe, Germany. His research interests include ellipsometry, opticaldesign, and precision metrology.

Veröffentlichungen


2021
Sensitivity enhanced roll-angle sensor by means of a quarter-waveplate
Chen, C.-W.; Hartrumpf, M.; Längle, T.; Beyerer, J.
2021. Technisches Messen, 88 (s1), s48–s52. doi:10.1515/teme-2021-0069
Robustness estimation of simple lens systems by machine learning
Chen, C.-W.; Zhou, B.; Längle, T.; Beyerer, J.
2021. International Optical Design Conference: in Proceedings OSA Optical Design and Fabrication 2021 (Flat Optics, Freeform, IODC, OFT) ; 27 June–1 July 2021, Washington, DC, United States, Art.-Nr.: 120781B, Optica Publishing Group (OSA). doi:10.1117/12.2603658
Characterization of Mueller matrices in retroreflexellipsometry
Chen, C.-W.
2021. Proceedings of the 2020 Joint Workshop of Fraunhofer IOSB and Institute for Anthropomatics, Vision and Fusion Laboratory. Ed.: J. Beyerer; T. Zander, 19–32, KIT Scientific Publishing. doi:10.5445/IR/1000135071
2020
Ellipsometric inline inspection of dielectric substrates with nonplanar surfaces
Hartrumpf, M.; Chen, C.-W.; Längle, T.; Beyerer, J.
2020. Technisches Messen, 87 (6), 6. doi:10.1515/teme-2019-0097
2019
An Overview of Ellipsometric Measurements for Nonplanar Surfaces
Chen, C.-W.
2019. Proceedings of the 2019 Joint Workshop of Fraunhofer IOSB and Institute for Anthropomatics, Vision and Fusion Laboratory. Ed.: J. Beyerer; T. Zander, 25–38, KIT Scientific Publishing
Retroreflex ellipsometry for isotropic substrates with nonplanar surfaces
Chen, C.-W.; Hartrumpf, M.; Längle, T.; Beyerer, J.
2019. Journal of vacuum science & technology / B, 38 (1), 014005. doi:10.1116/1.5121854
An Overview of Return-Path Ellipsometry
Chen, C.-W.
2019. Proceedings of the 2018 Joint Workshop of Fraunhofer IOSB and Institute for Anthropomatics, Vision and Fusion Laboratory. Ed.: J. Beyerer, M. Taphanel, 1–10, KIT Scientific Publishing