Dr.-Ing. Zheng Li

  • Karlsruher Institut für Technologie – KIT
    Lehrstuhl für Interaktive Echtzeitsysteme (IES)
    Prof. Dr.- Ing. Jürgen Beyerer
    c/o Technologiefabrik
    Haid-und-Neu-Str. 7
    76131 Karlsruhe

Lebenslauf

Zheng Li received his Master's degree from Karlsruhe School of Optics & Photonics (KSOP) at Karlsruhe Institute of Technology (KIT) in 2016 and his Bachelor's degree from School of Mechanical Engineering at Shanghai Jiao Tong University (SJTU) in 2013. Since September 2016, he has joined Lehrstuhl für Interaktive Echtzeitsysteme (IES) as a scientific staff. He has been working towards a PhD degree on advanced 3D measurement systems with diffractive optical elements.

Veröffentlichungen


2022
Application of diffractive lens arrays in confocal microscopy. Dissertation
Li, Z.
2022, Juni 9. KIT Scientific Publishing. doi:10.5445/KSP/1000145608
Confocal fluorescence microscopy with high-NA diffractive lens arrays
Li, Z.; Taphanel, M.; Längle, T.; Beyerer, J.
2022. Applied Optics, 61 (3), A37-A42. doi:10.1364/AO.442084
2021
Resolution enhancement of low-NA objectives in confocal fluorescence microscopy by diffractive lens arrays
Li, Z.; Taphanel, M.; Längle, T.; Beyerer, J.
2021. Proceedings of the International Optical Design Conference 2021. Ed.: P.P. Clark, 126 – 131, SPIE. doi:10.1117/12.2603633
DOE-based Multi-spot Confocal InterferenceMicroscope
Li, Z.
2021. Proceedings of the 2020 Joint Workshop of Fraunhofer IOSB and Institute for Anthropomatics, Vision and Fusion Laboratory. Ed.: J. Beyerer; T. Zander, 83–90, KIT Scientific Publishing
High-resolution confocal microscopy with low-NA objectives based on diffractive lens arrays
Li, Z.; Taphanel, M.; Längle, T.; Beyerer, J.
2021. Applied optics, 60 (22), F1–F5. doi:10.1364/AO.423933
2020
High-NA Confocal Measurement by Diffractive Optical Elements
Li, Z.
2020. Proceedings of the 2019 Joint Workshop of Fraunhofer IOSB and Institute for Anthropomatics, Vision and Fusion Laboratory. Hrsg.: J. Beyerer; T. Zander, 85–94, KIT Scientific Publishing
2019
THz-to-optical conversion in wireless communications using an ultra-broadband plasmonic modulator
Ummethala, S.; Harter, T.; Koehnle, K.; Li, Z.; Muehlbrandt, S.; Kutuvantavida, Y.; Kemal, J.; Marin-Palomo, P.; Schaefer, J.; Tessmann, A.; Garlapati, S. K.; Bacher, A.; Hahn, L.; Walther, M.; Zwick, T.; Randel, S.; Freude, W.; Koos, C.
2019. Nature photonics, 13 (8), 519–524. doi:10.1038/s41566-019-0475-6
Wireless THz-to-optical conversion with an electro-optic plasmonic modulator
Freude, W.; Ummethala, S.; Harter, T.; Koehnle, K.; Li, Z.; Muehlbrandt, S.; Kutuvantavida, Y.; Kemal, J. N.; Marin-Palomo, P.; Schaefer, J.; Tessmann, A.; Kumar Garlapati, S.; Bacher, A.; Hahn, L.; Walther, M.; Zwick, T.; Randel, S.; Koos, C.
2019. Light Conference 2019, Changchun, China, July 16 - 18
Application of DOE in confocal microscopy for surface measurement
Li, Z.; Taphanel, M.; Längle, T.; Beyerer, J.
2019. Photonics and Education in Measurement Science 2019. Ed.: M. Rosenberger, Art.-Nr.: 1114411, Society of Photo-optical Instrumentation Engineers (SPIE). doi:10.1117/12.2531610
Simplified Stokes polarimeter based on division-of-amplitude
Negara, C.; Li, Z.; Längle, T.; Beyerer, J.
2019. Photonics and Education in Measurement Science 2019. Ed.: M. Rosenberger, Art.-Nr.: 111441B, Society of Photo-optical Instrumentation Engineers (SPIE). doi:10.1117/12.2532399
Application of diffractive optical elements in confocal microscopy
Li, Z.
2019. Proceedings of the 2018 Joint Workshop of Fraunhofer IOSB and Institute for Anthropomatics, Vision and Fusion Laboratory. Ed.: J. Beyerer, M. Taphanel, 25–46, KIT Scientific Publishing
2018
Wireless Transmission at 0.3 THz Using Direct THz-to-Optical Conversion at the Receiver
Ummethala, S.; Harter, T.; Koehnle, K.; Li, Z.; Muehlbrandt, S.; Kutuvantavida, Y.; Kemal, J. N.; Schaefer, J.; Massler, H.; Tessmann, A.; Garlapati, S. K.; Bacher, A.; Hahn, L.; Walther, M.; Zwick, T.; Randel, S.; Freude, W.; Koos, C.
2018. 44th European Conference on Optical Communication (ECOC 2018), Rome, I, September 23-27, 2018, Article no: 8535490, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ECOC.2018.8535490