Prof. Dr.-Ing. Jürgen Beyerer
Director
Building: 07.21
Phone: +49 721 608-45911
Fax: +49 721 608-45926
Office Hours: on appointment; please contact our secretary
juergen beyerer does-not-exist.iosb fraunhofer de
Lehrstuhl für Interaktive Echtzeitsysteme
Adenauerring 4
76131 Karlsruhe
Germany

Prof. Dr.-Ing. Jürgen Beyerer ist Inhaber des 2004 eingerichteten Lehrstuhls für Interaktive Echtzeitsysteme an der Fakultät für Informatik. Gleichzeitig ist er Leiter des Fraunhofer-Instituts für Optronik, Systemtechnik und Bildauswertung (IOSB) in Karlsruhe (bis 2009: Fraunhofer IITB).

Prof. Beyerer studierte von 1984 bis 1989 Elektrotechnik an der Universität Karlsruhe und promovierte 1994 am Institut für Mess- und Regelungstechnik (MRT) bei Prof. Franz Mesch mit einer Arbeit zur Texturanalyse, die 1995 mit dem Messtechnikpreis des AHMT (Arbeitskreis der Hochschullehrer für Messtechnik e.V.) ausgezeichnet wurde. Anschließend baute er eine Forschungsgruppe zum Thema Automatische Sichtprüfung und Bildverarbeitung am gleichen Institut auf. 1999 habilitierte er sich für das Fach Messtechnik mit einer Arbeit zum Thema der Nutzung von Vorwissen in der Messtechnik. Von 1999 bis 2004 leitete er das Mannheimer Mittelstands-Unternehmen Hottinger Systems GmbH (heute: inspectomation GmbH) und war stellvertretender Geschäftsführer des Schwesterunternehmens Hottinger Maschinenbau GmbH.

Lehrstuhl und Fraunhofer IOSB arbeiten inhaltlich eng zusammen. Damit lassen sich Synergieeffekte, die in der eher grundlagenorientierten Herangehensweise am Lehrstuhl und der anwendungsorientierten Ausrichtung des IOSB liegen, optimal erschließen. Daneben fördert eine enge Kooperation die Gewinnung erstklassiger Nachwuchswissenschaftler für das Fraunhofer IOSB.


Vorlesungen
Wintersemester
Sommersemester
Publications
TitleAuthorsSource
Köhl, P.; Specker, A.; Schumann, A.; Beyerer, J.The IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) Workshops, 2020.
Chen, C.-W.; Hartrumpf, M.; Längle, T.; Beyerer, J.Journal of Vacuum Science Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena 38 no. 1, pp. 014005, 2020.
Negara, C.; Li, Z.; Längle, T.; Beyerer, J.Photonics and Education in Measurement Science 2019, vol. 11144, pp. 316 -- 325, SPIE, 2019.
Li, Z.; Taphanel, M.; Längle, T.; Beyerer, J.Photonics and Education in Measurement Science 2019, vol. 11144, pp. 254 -- 261, SPIE, 2019.
Wagner, P. G.; Birnstill, P.; Beyerer, J.International Workshop on Security and Trust Management, pp. 107--123, 2019.
Specker, A.; Schumann, A.; Beyerer, J.Advanced Video and Signal Based Surveillance (AVSS), 2019 16th IEEE International Conference on, 2019.
Chen, C.-W.; Hartrumpf, M.; Längle, T.; Beyerer, J.tm - Technisches Messen 86 no. s1, pp. 32--36, De Gruyter Oldenbourg, 2019.
Bauckhage, C.; Bauernhansl, T.; Beyerer, J.; Garcke, J.Neugebauer, R. (ed.), Digital Transformation, pp. 231-251, Springer Berlin Heidelberg, 2019.
Müller-Quade, J.; Beyerer, J.; Broadnax, B.Müller-Quade, J.; Beyerer, J.; Broadnax, B. (eds.), at – Automatisierungstechnik 2019, 67(5), pp. 359 - 360, De Gruyter Oldenbourg, Berlin, 2019.
Pfrang, S.; Borcherding, A.; Meier, D.; Beyerer, J.at-Automatisierungstechnik 67 no. 5, pp. 383--401, De Gruyter Oldenbourg, 2019.
Janya-anurak, C.; Bernard, T.; Beyerer, J.at-Automatisierungstechnik 67 no. 4, pp. 283--303, De Gruyter Oldenbourg, 2019.
Beyerer, J.; León, F. P.; Längle, T. (eds.)KIT Scientific Publishing, Karlsruhe, 2019.
Hartrumpf, M.; Chen, C.-W.; Längle, T.; Beyerer, J.tm - Technisches Messen, De Gruyter Oldenbourg, 2019.
Beyerer, J.; Tchouchenkov, I.Betriebliche Prävention Ausgabe 10/2019 , pp. 378 - 384, Erich Schmidt Verlag GmbH & Co. KG, Berlin, 2019.
Maier, G.; Mürdter, N.; Gruna, R.; Längle, T.; Beyerer, J.Beyerer, J.; León, F. P.; Längle, T. (eds.), OCM 2019 - Optical Characterization of Materials : Conference Proceedings, pp. 87 - 97, Karlsruhe: KIT Scientific Publishing, 2019.
Beyerer, J.; Maier, A.; Niggemann, O. (eds.)Springer Vieweg, Berlin, 2019.
Beyerer, J.; Geisler, J.Beyerer, J.; Winzer, P. (eds.), Beiträge zu einer Systemtheorie Sicherheit, pp. 73 - 87, Herbert Utz Verlag, München, 2018.
Bertsche, B.; Beyerer, J.; Digmayer, C.; Goldschmidt, R.; Jakobs, E.-M.; Renn, O.; Schlüter, N.; Winzer, P.; Weyer, J.Beyerer, J.; Winzer, P. (eds.), Beiträge zu einer Systemtheorie Sicherheit, pp. 59 - 72, Herbert Utz Verlag, München, 2018.
Beyerer, J.Beyerer, J.; Winzer, P. (eds.), Beiträge zu einer Systemtheorie Sicherheit, pp. 9 - 14, Herbert Utz Verlag, München, 2018.
Pieper, C.; Pfaff, F.; Maier, G.; Kruggel-Emden, H.; Wirtz, S.; Noack, B.; Gruna, R.; Scherer, V.; Hanebeck, U. D.; Längle, T.; Beyerer, J.Powder technology 340, pp. 181--193, Elsevier, München, 2018.
Beyerer, J.; Kühnert, C.; Niggemann, O. (eds.)Springer, Berlin, 2018.
Maier, G.; Pfaff, F.; Becker, F.; Pieper, C.; Gruna, R.; Noack, B.; Kruggel-Emden, H.; Längle, T.; Hanebeck, U.; Wirtz, S.; Scherer, V.; Beyerer, J.tm - Technisches Messen 85 no. 3, pp. 202-210, De Gruyter, Oldenbourg, 2018.
Beyerer, J.; Winzer, P.Herbert Utz Verlag, München, 2018.
Gewohn, M.; Beyerer, J.; Usländer, T.; Sutschet, G.IFAC-PapersOnLine 51 no. 11, pp. 423--428, Elsevier, 2018.
Gewohn, M.; Beyerer, J.; Usländer, T.; Sutschet, G.2018 International Conference on Information Management and Processing (ICIMP), pp. 54--60, 2018.
Maier, G.; Pfaff, F.; Pieper, C.; Gruna, R.; Noack, B.; Kruggel-Emden, H.; Längle, T.; Hanebeck, U. D.; Wirtz, S.; Scherer, V.; Beyerer, J.In: Sensor-Based Sorting & Control 2018, pp. 73 - 81, Shaker Verlag, Aachen, 2018.
Gewohn, M.; Beyerer, J.; Usländer, T.; Sutschet, G., pp. 54 - 60IEEE, Piscataway, NJ, 2018.
Pfrang, S.; Meier, D.; Friedrich, M.; Beyerer, J., pp. 570-5802018.
Beyerer, J.; Pak, A.; Taphanel, M. (eds.)Karlsruher Schriften zur Anthropomatik / Lehrstuhl für Interaktive Echtzeitsysteme, Karlsruher Institut für Technologie ; Fraunhofer-Inst. für Optronik, Systemtechnik und Bildauswertung IOSB Karlsruhe, vol. 34, KIT Scientific Publishing, Karlsruhe, 2018.
Beyerer, J.; Müller-Quade, J.; Reussner, R.Datenschutz und Datensicherheit-DuD 42 no. 5, pp. 277--280, Springer, 2018.
Bauckhage, C.; Bauernhansl, T.; Beyerer, J.; Garcke, J.Digitalisierung, pp. 239--260, Springer, 2018.
Kopf, M.; Gruna, R.; Längle, T.; Beyerer, J.tm - Technisches Messen 85, 2018.
Krempel, E.; Beyerer, J.Proceedings of the 11th PErvasive Technologies Related to Assistive Environments Conference, PETRA '18, pp. 327--330, ACM, 2018.
Wagner, P. G.; Birnstill, P.; Beyerer, J.Proceedings of the 23Nd ACM on Symposium on Access Control Models and Technologies, SACMAT '18, pp. 85--91, ACM, 2018.
Birnstill, P.; Beyerer, J.Proceedings of the 11th PErvasive Technologies Related to Assistive Environments Conference, PETRA '18, pp. 292--296, ACM, 2018.
Birnstill, P.; Krempel, E.; Wagner, P. G.; Beyerer, J.Technologies 6(4), 2018.
Sommer, L. W.; Schuchert, T.; Beyerer, J.IEEE Transactions on Circuits and Systems for Video Technology, pp. 1-15, IEEE, Piscataway, New York, 2018.
Schumann, A.; Specker, A.; Beyerer, J.Advanced Video and Signal Based Surveillance (AVSS), 2018 15th IEEE International Conference on, 2018.
Sommer, L. W.; Acatay, O.; Schumann, A.; Beyerer, J.Advanced Video and Signal Based Surveillance (AVSS), 2018 15th IEEE International Conference on, 2018.
Acatay, O.; Sommer, L. W.; Schumann, A.; Beyerer, J.Advanced Video and Signal Based Surveillance (AVSS), 2018 15th IEEE International Conference on, 2018.
Schumann, A.; Sommer, L. W.; Vogler, M.; Beyerer, J.Advanced Video and Signal Based Surveillance (AVSS), 2018 15th IEEE International Conference on, 2018.
Valev, K.; Schumann, A.; Sommer, L. W.; Beyerer, J.Pattern Recognition and Tracking XXIX, vol. 10649, pp. 1064902, 2018.
Sommer, L. W.; Steinmann, L.; Schumann, A.; Beyerer, J.Automatic Target Recognition XXVIII, vol. 10648, pp. 1064803, 2018.
Sommer, L. W.; Schumann, A.; Schuchert, T.; Beyerer, J.2018 IEEE Winter Conference on Applications of Computer Vision (WACV), pp. 635--642, 2018.
Nie, K.; Sommer, L. W.; Schumann, A.; Beyerer, J.2018 IEEE Winter Conference on Applications of Computer Vision (WACV), pp. 626--634, 2018.
Sommer, L. W.; Schmidt, N.; Schumann, A.; Beyerer, J.2018 25th IEEE International Conference on Image Processing (ICIP), pp. 3054--3058, 2018.
Mohammadikaji, M.; Bergmann, S.; Burke, J.; Beyerer, J.; Dachsbacher, C.tm - Technisches Messen 85 no. s1, pp. 95-102, 2018.
Philipp, P.; Bommersheim, M.; Robert, S.; Hempel, D.; Beyerer, J.WorldComp 2018, World Congress in Computer Science, Computer Engineering, and Applied Computing : HIMS 2018, International Conference on Health Informatics and Medical Systems, Las Vegas, Nevada, USA, pp. 83-89, 2018.
Meyer, J.; Melchert, W.; Hartrumpf, M.; Längle, T.; Beyerer, J.In Proceedings of SPIE Photonics Europe, Volume 10677, pp. 1 - 11, 2018.
Meyer, J.; Längle, T.; Beyerer, J.In Proceedings of SPIE Optical Systems Design, Volume 10693, pp. 1 - 10, 2018.
Philipp, P.; Robert, S.; Hempel, D.; Beyerer, J.CogSIMA 2018, IEEE Conference on Cognitive and Computational Aspects of Situation Management, pp. 15-21, 2018.
Pfrommer, J.; Zimmerling, C.; Liu, J.; Kärger, L.; Henning, F.; Beyerer, J.Proceedings of the 51st CIRP Conference on Manufacturing Systems, CIRP, 2018.
Pieper, C.; Pfaff, F.; Maier, G.; Kruggel-Emden, H.; Wirtz, S.; Noack, B.; Gruna, R.; Scherer, V.; Hanebeck, U. D.; Längle, T.; Beyerer, J.Powder Technology, 2018.
Patzer, F.; Meshram, A.; Birnstill, P.; Haas, C.; Beyerer, J.Lecture Notes in Computer Science book series (LNCS, volume 11260), pp. 45--56, Springer, Cham , 2018.
Herrmann, C.; Ruf, M.; Beyerer, J.Proc. SPIE 10643, Autonomous Systems: Sensors, Vehicles, Security, and the Internet of Everything, pp. 10643 - 08, SPIE, Bellingham, 2018, 2018.
Mohammadikaji, M.; Bergmann, S.; Irgenfried, S.; Beyerer, J.; Dachsbacher, C.; Worn, H.2018 Workshop on Metrology for Industry 4.0 and IoT, pp. 52-67, 2018.
Herrmann, C.; Metzler, J.; Willersinn, D.; Beyerer, J.Proc. SPIE 10576, Medical Imaging 2018: Image-Guided Procedures, Robotic Interventions, and Modeling, pp. 10576-86, SPIE, Bellingham, 2018.
Tüzkö, A.; Herrmann, C.; Manger, D.; Beyerer, J.Proceedings of the 13th International Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications - Volume 4: VISAPP 2018, pp. 284-292, SciTePress, Setúbal, 2018.
Ortelt, B.; Herrmann, C.; Willersinn, D.; Beyerer, J.Proceedings of the 13th International Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications - Volume 4: VISAPP 2018, pp. 371-378, SciTePress, Setúbal, 2018.
Gewohn, M.; Usländer, T.; Beyerer, J.; Sutschet, G.2017 11th CIRP Conference on Intelligent Computation in Manufacturing Engineering (CIRP ICME'17), 2017.
Anneken, M.; Fischer, Y.; Beyerer, J.Proceedings of the 9th International Conference on Agents and Artificial Intelligence (ICAART), pp. 200--207, 2017.
Luo, D.; Längle, T.; Beyerer, J.tm-Technisches Messen 84 no. 7-8, pp. 452--459, De Gruyter Oldenbourg, 2017.
Meyer, J.; Längle, T.; Beyerer, J.IEEE Computing Conference (2017), IEEE, 2017.
Meyer, J.; Längle, T.; Beyerer, J.20th Scandinavian Conference on Image Analysis (SCIA 2017), pp. 526-537, Springer, Cham, 2017.
Meyer, J.; Längle, T.; Beyerer, J.25th International Conference in Central Europe on Computer Graphics, Visualization and Computer Vision (WSCG 2017), pp. 147-152, UNION Agency, Plzen, 2017.
Coluccia, A.; Ghenescu, M.; Piatrik, T.; Cubber, G. D.; Schumann, A.; Sommer, L. W.; Klatte, J.; Schuchert, T.; Beyerer, J.; Farhadi, M.; others,Advanced Video and Signal Based Surveillance (AVSS), 2017 14th IEEE International Conference on, pp. 1--6, 2017.
Sommer, L. W.; Schumann, A.; Müller, T.; Schuchert, T.; Beyerer, J.Advanced Video and Signal Based Surveillance (AVSS), 2017 14th IEEE International Conference on, pp. 1--6, 2017.
Schumann, A.; Sommer, L. W.; Klatte, J.; Schuchert, T.; Beyerer, J.Advanced Video and Signal Based Surveillance (AVSS), 2017 14th IEEE International Conference on, pp. 1--6, 2017.
Sommer, L. W.; Nie, K.; Schumann, A.; Schuchert, T.; Beyerer, J.Advanced Video and Signal Based Surveillance (AVSS), 2017 14th IEEE International Conference on, pp. 1--6, 2017.
Sommer, L. W.; Schuchert, T.; Beyerer, J.Applications of Computer Vision (WACV), 2017 IEEE Winter Conference on, pp. 311--319, 2017.
Irgenfried, S.; Wörn, H.; Bergmann, S.; Mohammadikaji, M.; Beyerer, J.; Dachsbacher, C.International Conference on Information Systems Architecture and Technology, pp. 326--335, 2017.
Irgenfried, S.; Wörn, H.; Bergmann, S.; Mohammadikaji, M.; Beyerer, J.; Dachsbacher, C.at - Automatisierungstechnik 65 no. 6, 2017.
Irgenfried, S.; Bergmann, S.; Mohammadikaji, M.; Beyerer, J.; Dachsbacher, C.; Wörn, H.Automated Visual Inspection and Machine Vision II, vol. 10334, 2017.
Mohammadikaji, M.; Bergmann, S.; Irgenfried, S.; Beyerer, J.; Dachsbacher, C.; Wörn, H.Applications of Computer Vision (WACV), 2017 IEEE Winter Conference on, pp. 1008--1016, 2017.
Philipp, P.; Bleier, J.; Fischer, Y.; Beyerer, J.Radermacher, K.; Baena, F. R. Y. (eds.), CAOS 2017. 17th Annual Meeting of the International Societyfor Computer Assisted Orthopaedic Surgery, EPiC Series in Health Sciences, vol. 1, pp. 288--294, 2017.
Philipp, P.; Beyerer, J.; Fischer, Y.Cognitive and Computational Aspects of Situation Management(CogSIMA), 2017 IEEE Conference on, pp. 1--7, 2017.
Krempel, E.; Birnstill, P.; Beyerer, J.European Journal for Security Research online first, Springer, 2017.
Wagner, P. G.; Birnstill, P.; Krempel, E.; Bretthauer, S.; Beyerer, J.Data Privacy Management, Cryptocurrencies and Blockchain Technology, pp. 183--201, Springer, 2017.
Retzlaff, M.-G.; Hanika, J.; Beyerer, J.; Dachsbacher, C.Journal of Sensors and Sensor Systems 6 no. 1, pp. 171-184, 2017.
Jarvis, J.; Haertelt, M.; Hugger, S.; Butschek, L.; Fuchs, F.; Ostendorf, R.; Wagner, J.; Beyerer, J.Advanced Optical Technologies 6 no. 2, pp. 85--93, 2017.
Herrmann, C.; Willersinn, D.; Beyerer, J.Image Analysis - 20th Scandinavian Conference, SCIA 2017 (Lecture Notes in Computer Science 10269), pp. 377-388, Springer, 2017.
Sommer, L. W.; Schuchert, T.; Beyerer, J.Proc. SPIE 10202, Automatic Target Recognition XXVII, 2017.
Hild, J.; Krüger, W.; Brüstle, S.; Trantelle, P.; Unmüßig, G.; Voit, M.; Heinze, N.; Peinsipp-Byma, E.; Beyerer, J.Proc. SPIE 10199, Geospatial Informatics, Fusion, and Motion Video Analytics VII, pp. 1019903-1019903-9, 2017.
Maier, S.; Camp, F. v. d.; Hafermann, J.; Wagner, B.; Peinsipp-Byma, E.; Beyerer, J.Proc. SPIE 10190, Ground/Air Multisensor Interoperability, Integration, and Networking for Persistent ISR VIII, pp. 101901D-101901D-10, 2017.
Maier, G.; Pfaff, F.; Becker, F.; Pieper, C.; Gruna, R.; Noack, B.; Kruggel-Emden, H.; Längle, T.; Hanebeck, U.; Wirtz, S.; Scherer, V.; Beyerer, J.KIT Scientific Publishing, K. (ed.), Proceedings of the 3rd Conference on Optical Characterization of Materials (OCM 2017), 2017.
Luo, D.; Taphanel, M.; Längle, T.; Beyerer, J.Applied Optics 56 no. 8, pp. 2155-3165, OSA, 2017.
Qu, C.; Herrmann, C.; Monari, E.; Schuchert, T.; Beyerer, J.Proceedings of the 17th IEEE Winter Conference on Applications of Computer Vision (WACV), pp. 1105--1114, IEEE, 2017.
Frühberger, P.; Stephan, T.; Burke, J.; Beyerer, J.Oral, A. Y.; Bahsi Oral, Z. B. (eds.), 3rd International Multidisciplinary Microscopy and Microanalysis Congress (InterM): Proceedings, Oludeniz, Turkey, 19-23 October 2015, pp. 223--228, Springer International Publishing, 2017.
Birnstill, P.; Bier, C.; Wagner, P. G.; Beyerer, J.SAM 2016 : proceedings of the 2016 International Conference on Security Management : WORLDCOMP extquotesingle 16, July 25-28, 2016, Las Vegas, Nevada, USA. Ed.: Kevin imi, pp. 185-191, CSREA Press, Bloomfield, 2016.
Sommer, L. W.; Schuchert, T.; Beyerer, J.Pattern Recogniton in Remote Sensing (PRRS), 2016 9th IAPR Workshop on, pp. 1--6, 2016.
Beyerer, J.; Usländer, T.at - Automatisierungstechnik 64 no. 9, pp. 697-698, De Gruyter, 2016.
Luo, D.; Längle, T.; Beyerer, J.Forum Bildverarbeitung 2016, pp. 185-195, 2016.
Meyer, J.; Längle, T.; Beyerer, J.tm - Technisches Messen 83 no. 12, pp. 731-738, De Gruyter, 2016.
Meyer, J.; Längle, T.; Beyerer, J.Forum Bildverarbeitung 2016, pp. 75-86, 2016.
Herrmann, C.; Willersinn, D.; Beyerer, J.Proceedings of the 2016 International Conference on Digital Image Computing: Techniques and Applications (DICTA), pp. 244-250, IEEE, 2016.
Wagner, P. G.; Birnstill, P.; Krempel, E.; Bretthauer, S.; Beyerer, J.Springer, (ed.), Informatik 2016 – Informatik von Menschen für Menschen, GI-Edition: Lecture Notes in Informatics (LNI), pp. 427-440, Springer, 2016.
Beyerer, J.; Geisler, J.European Journal of Security Research 1 no. 2, pp. 135-150, Springer, 2016.
Richter, M.; Längle, T.; Beyerer, J.Proceedings of the 23rd International Conference on Patter Recognition, 2016.
Retzlaff, M.-G.; Richter, M.; Längle, T.; Beyerer, J.; Dachsbacher, C.Forum Bildverarbeitung 2016, 2016.
Ziehn, J.; Ruf, M.; Rosenhahn, B.; Willersinn, D.; Beyerer, J.; Gotzig, H.Proceedings of the IEEE 19th International Conference on Intelligent Transportation Systems (ITSC 2016), pp. 1410-1417, IEEE, 2016.
Sommer, L. W.; Schuchert, T.; Beyerer, J.Proc. SPIE 9988, Electro-Optical Remote Sensing X, 99880N, 2016.
Dunau, P.; Beyerer, J.Proceedings of the 19th International Conference on Information Fusion (FUSION), pp. 1735-1742, IEEE, 2016.
Kuwertz, A.; Beyerer, J.Journal of Applied Logic 19 no. 2, pp. 102-127, Elsevier, 2016.
Fischer, Y.; Krempel, E.; Birnstill, P.; Unmüßig, G.; Monari, E.; Moßgraber, J.; Schenk, M.; Beyerer, J.Proceedings of the 9th Future Security 2014. Security Research Conference, pp. 91-99, Fraunhofer Verlag, Stuttgart, 2016.
Philipp, P.; Schreiter, L.; Giehl, J.; Fischer, Y.; Raczkowsky, J.; Schwarz, M.; Wörn, H.; Beyerer, J.6th Joint Workshop on New Technologies for Computer/Robot Assisted Surgery at CRAS 2016, pp. 45-46, 2016.
Ruf, M.; Ziehn, J.; German, L.; Rosenhah, B.; Willersinn, D.; Beyerer, J.; Gotzig, H.Proceedings of the IEEE International Conference on Instrumentation, Control and Automation (ICA 2016), pp. 189-196, IEEE, 2016.
Richter, M.; Maier, G.; Gruna, R.; Längle, T.; Beyerer, J.Proceedings of the 2nd World Congress on Electrical Engineering and Computer Systems and Science (EECSS’16), pp. 104.1-104.8, Avestia Publishing, 2016.
Birnstill, P.; Bier, C.; Wagner, P.; Beyerer, J.Proceedings of the International Conference on Security and Management, SAM 2016, pp. 185-191, CSREA Press, 2016.
Remondino, F.; Shortis, M.; Beyerer, J.; León, F. P. (eds.)SPIE Optical Metrology, 2016.
Retzlaff, M.-G.; Hanika, J.; Beyerer, J.; Dachsbacher, C.Sensoren und Messsysteme 2016, 2016.
Niggemann, O.; Beyerer, J. (eds.)Springer, 2016.
Herrmann, C.; Müller, T.; Willersinn, D.; Beyerer, J.lProc. SPIE 9987, Electro-Optical and Infrared Systems: Technoogy and Applications, 99870I, 2016.
Herrmann, C.; Willersinn, D.; Beyerer, J.Proceedings of the 13th IEEE International Conference on Advanced Video and Signal Based Surveillance, IEEE, 2016., IEEE, 2016.
Meyer, J.; Längle, T.; Beyerer, J.Proceedings of the 2nd International Conference on Frontiers of Signal Processing (ICFSP 2016), pp. 104-109, 2016.
Anneken, M.; Fischer, Y.; Beyerer, J.Proceedings of the 8th International Conference on Agents and Artificial Intelligence, pp. 250-257, 2016.
Anneken, M.; Fischer, Y.; Beyerer, J.Bi, Y.; Kapoor, S.; Bhatia, R. (eds.), Intelligent Systems and Applications, vol. 650, pp. 89-107, Springer International Publishing, 2016.
Bergmann, S.; Mohammadikaji, M.; and Irgenfried, S.; Wörn, H.; Beyerer, J.; Dachsbacher, C.Hullin, M.; Stamminger, M.; Weinkauf, T. (eds.), Vision, Modeling Visualization, The Eurographics Association, 2016.
Mohammadikaji, M.; Bergmann, S.; Irgenfried, S.; Beyerer, J.; Dachsbacher, C.; Wörn, H.XXX Messtechnisches Symposium, De Gruyter, 2016.
Mohammadikaji, M.; Bergmann, S.; Irgenfried, S.; Beyerer, J.; Dachsbacher, C.; Wörn, H.2016 IEEE International Instrumentation and Measurement Technology Conference Proceedings, pp. 1--6, 2016.
Anneken, M.; Fischer, Y.; Beyerer, J.Security Research Conference 11th Future Security, pp. 331-337, Fraunhofer Verlag, 2016.
Broadnax, B.; Birnstill, P.; Müller-Quade, J.; Beyerer, J.Security Research Conference 11th Future Security, pp. 323-330, Fraunhofer Verlag, 2016.
Krempel, E.; Birnstill, P.; Beyerer, J.Security Research Conference 11th Future Security, pp. 315-322, Fraunhofer Verlag, 2016.
Bier, C.; Beyerer, J.Security Research Conference 11th Future Security, pp. 293-298, Fraunhofer Verlag, 2016.
Hammer, J. H.; Qu, C.; Voit, M.; Beyerer, J.20th International Conference on Image Processing, Computer Vision, & Pattern Recognition, 2016.
Hammer, J. H.; Voit, M.; Beyerer, J.2016 19th International Conference on Information Fusion (FUSION), pp. 1743-1750, 2016.
Meyer, J.; Längle, T.; Beyerer, J.Irish Machine Vision & Image Processing Conference Proceedings 2016, pp. 9-16, 2016.
Meyer, J.; Gruna, R.; Längle, T.; Beyerer, J.Electronic Imaging 2016 no. 19, pp. 1-9, 2016.
Luo, D.; Bauer, S.; Taphanel, M.; Längle, T.; León, F. P.; Beyerer, J.Proceedings of SPIE Next-Generation Spec, pp. 98550P-98550P-9, SPIE, 2016.
Philipp, P.; Fischer, Y.; Hempel, D.; Beyerer, J.Emerging Trends in Applications and Infrastructures for Computational Biology, Bioinformatics, and Systems Biology, pp. 371-390, Elsevier, 2016.
Qu, C.; Luo, D.; Monari, E.; Schuchert, T.; Beyerer, J.Proceedings of the 23rd IEEE International Conference on Image Processing (ICIP), IEEE, 2016.
Schreiter, L.; Philipp, P.; Giehl, J.; Fischer, Y.; Raczkowsky, J.; Schwarz, M.; Beyerer, J.; Wörn, H.Proceedings of Computer Assisted Radiology and Surgery (CARS), 2016.
Sommer, L. W.; Teutsch, M.; Schuchert, T.; Beyerer, J.Proceedings of the IEEE Winter Conference on Applications of Computer Vision (WACV), 2016, pp. 1-9, IEEE, 2016.
Richter, M.; Vieth, K.-U.; Längle, T.; Beyerer, J.Proceedings of the 7th Sensor-Based Sorting & Control 2016, pp. 169-177, 2016.
Beyerer, J.; Puente León, F.; Frese, C.Springer, 2016.
Taphanel, M.; Beyerer, J.tm Technisches Messen 82 no. 2, pp. 94-101, Oldenbourg Wissenschaftsverlag, 2015.
Dunau, P.; Fitz, D.; Beyerer, J.tm Technisches Messen 82 no. 5, pp. 262-272, Oldenbourg Wissenschaftsverlag, 2015.
Retzlaff, M.-G.; Stabenow, J.; Beyerer, J.; Dachsbacher, C.tm Technisches Messen 82 no. 3, pp. 251-261, Oldenbourg Wissenschaftsverlag, 2015.
Richter, M.; Längle, T.; Beyerer, J.tm Technisches Messen 82 no. 2, pp. 663-671, Oldenbourg Wissenschaftsverlag, 2015.
Rauschenbach, T.; Beyerer, J.at-Automatisierungstechnik 63 no. 5, pp. 232-324, Oldenbourg Wissenschaftsverlag, 2015.
Anneken, M.; Fischer, Y.; Beyerer, J.Proceedings of 2015 SAI Intelligent Systems Conference (IntelliSys), 2015.
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Gruna, R.; Beyerer, J.Proc. IEEE Instrumentation and Measurement Technology Conference, pp. 498-503, 2010.
Sander, J.; Heizmann, M.; Goussev, I.; Beyerer, J.Braun, J. J. (ed.), Multisensor, Multisource Information Fusion: Architectures, Algorithms, and Applications, Proceedings of SPIE Vol. 7710, 2010.
Heizmann, M.; Gheta, I.; Puente León, F.; Beyerer, J.Puente León, F.; Sommer, K.-D.; Heizmann, M. (eds.), Verteilte Messsysteme, pp. 133-152, KIT Scientific Publishing, 2010.
Vagts, H.; Beyerer, J.Puente León, F.; Sommer, K.-D.; Heizmann, M. (eds.), Verteilte Messsysteme, pp. 207-218, KIT Scientific Publishing, 2010.
Grinberg, M.; Ohr, F.; Willersinn, D.; Beyerer, J.Proceedings of the 7th International Workshop on Intelligent Transportation (WIT), pp. 29-34, 2010.
Beyerer, J.; Huber, M. (eds.)Karlsruher Schriften zur Anthropomatik, vol. 4, KIT Scientific Publishing, 2010.
Bader, T.; Beyerer, J.IUI Workshop on Eye Gaze in Intelligent Human Machine Interaction, 2010.
Beyerer, J.; Tacke, M.Strategie & Technik 52 no. 2, pp. 70-71, Report-Verlag, 2010.
Gheta, I.; Höfer, S.; Heizmann, M.; Beyerer, J.Fofi, D.; Niel, K. (eds.), Image Processing: Machine Vision Applications III, IS&T/SPIE Electronic Imaging, Proceedings of SPIE, vol. 7538, 2010.
Werling, S.; Mai, M.; Heizmann, M.; Beyerer, J.Metrology and Measurement Systems XVI no. 3, pp. 415-431, Polish Academy of Science, 2009.
Dillmann, R.; Beyerer, J.; Stiller, C.; Zöllner, J. M.; Gindele, T. (eds.)Informatik Aktuell, Springer, 2009.
Grinberg, M.; Ohr, F.; Beyerer, J.Dillmann, R.; Beyerer, J.; Stiller, C.; Zöllner, J. M.; Gindele, T. (eds.), Autonome Mobile Systeme, pp. 193-200, Springer, 2009.
Frese, C.; Batz, T.; Beyerer, J.Dillmann, R.; Beyerer, J.; Stiller, C.; Zöllner, J. M.; Gindele, T. (eds.), Autonome Mobile Systeme, pp. 193-200, Springer, 2009.
Grinberg, M.; Ohr, F.; Beyerer, J.Proceedings of the 12th International IEEE Conference on Intelligent Transportation Systems, pp. 291-298, 2009.
Vagts, H.; Beyerer, J.Elsner, P. (ed.), Future Security: 4th Security Research Conference, pp. 94-116, Fraunhofer Verlag, 2009.
Bauer, A.; Emter, T.; Vagts, H.; Beyerer, J.Elsner, P. (ed.), Future Security: 4th Security Research Conference, pp. 339-345, Fraunhofer Verlag, 2009.
Vagts, H.; Emter, T.; Bauer, A.; Beyerer, J.Elsner, P. (ed.), Future Security: 4th Security Research Conference, pp. 375-382, Fraunhofer Verlag, 2009.
Werling, S.; Mai, M.; Heizmann, M.; Beyerer, J.Metrology and Measurement Systems 16 no. 3, pp. 415-431, Polish Academy of Sciences, 2009.
Bader, T.; Räpple, R.; Beyerer, J.Jiang, X.; Petkov, N. (eds.), Computer Analysis of Images and Patterns, pp. 689-696, Springer, 2009.
Heizmann, M.; Beyerer, J.; Puente León, F.QZ Qualität und Zuverlässigkeit 54 no. 6, pp. 35-39, 2009.
Beyerer, J.; Heizmann, M.Bullinger, H.-J. (ed.), Technology Guide, pp. 150-155, Springer, 2009.
Batz, T.; Watson, K.; Beyerer, J.Proceedings of IEEE Intelligent Vehicles Symposium, pp. 907-912, 2009.
Sander, J.; Heizmann, M.; Goussev, I.; Beyerer, J.Dasarathy, B. (ed.), Multisensor, Multisource Information Fusion: Architectures, Algorithms, and Applications, Proceedings of SPIE Vol. 7345, 2009.
Beyerer, J.Geisler, J.; Beyerer, J. (eds.), Mensch-Maschine-Systeme, Karlsruher Schriften zur Anthropomatik, vol. 3, pp. 58-69, KIT Scientific Publishing, 2009.
Geisler, J.; Beyerer, J. (eds.)Karlsruher Schriften zur Anthropomatik, vol. 3, KIT Scientific Publishing, 2009.
Sander, J.; Beyerer, J.Robotics and Autonomous Systems 57 no. 3, pp. 259-267, Elsevier, 2009.
Frese, C.; Batz, T.; Beyerer, J.at - Automatisierungstechnik 56 no. 12, pp. 644-652, Oldenbourg Wissenschaftsverlag, 2008.
Gheta, I.; Heizmann, M.; Beyerer, J.Boström, H.; Johansson, R.; van Laere, J. (eds.), Proceedings of the second Skövde Workshop on Information Fusion Topics, pp. 9-12, Skövde Studies in Informatics, 2008.
Lellmann, J.; Balzer, J.; Rieder, A.; Beyerer, J.International Journal of Computer Vision 80 no. 2, pp. 226-241, 2008.
Gheta, I.; Heizmann, M.; Mathias, M.; Beyerer, J.Tagungsband des XXII. Messtechnischen Symposiums, pp. 157-168, Shaker Verlag, 2008.
Emter, T.; Gheta, I.; Beyerer, J.Thoma, K. (ed.), Future Security: 3rd Security Research Conference, pp. 315-320, Fraunhofer IRB Verlag, 2008.
Beyerer, J.; Geisler, J.Thoma, K. (ed.), Future Security: 3rd Security Research Conference, pp. 155-160, Fraunhofer IRB Verlag, 2008.
Gheta, I.; Heizmann, M.; Beyerer, J.tm - Technisches Messen 75 no. 7-8, pp. 445-454, Oldenbourg Wissenschaftsverlag, 2008.
Gheta, I.; Heizmann, M.; Beyerer, J.Proceedings of Fusion 2008, pp. 1731-1737, 2008.
Sander, J.; Beyerer, J.Proceedings of Fusion 2008, pp. 1035-1042, 2008.
Beyerer, J.; Heizmann, M.; Sander, J.; Gheta, I.Stathaki, T. (ed.), Image Fusion: Algorithms and Applications, pp. 157-192, Academic Press, 2008.
Puente León, F.; Beyerer, J.Puente León, F. (ed.), Reports on Distributed Measurement Systems, pp. 19-30, Shaker, 2008.
Beyerer, J.; Puente León, F.Puente León, F. (ed.), Reports on Distributed Measurement Systems, pp. 87-106, Shaker, 2008.
Frese, C.; Batz, T.; Wieser, M.; Beyerer, J.Proceedings of IEEE Intelligent Vehicles Symposium, pp. 1125-1130, 2008.
Beyerer, J.Stober, R. (ed.), Sicherheitsgewerbe und Sicherheitstechnik - Von der Personalisierung zur Technisierung, pp. 1-10, Carl Heymanns Verlag, 2008.
Gheta, I.; Mathias, M.; Heizmann, M.; Beyerer, J.Multisensor, Multisource Information Fusion: Architectures, Algorithms, and Applications, Proceedings of SPIE 6974, 2008.
Beyerer, J.Strategie & Technik, pp. 102-105, Report-Verlag, 2008.
Syrbe, M.; Beyerer, J.Czichos, H.; Hennecke, M. (Hrsg.): Hütte - Das Ingenieurwissen. 33. Auflage, S. K80-K99, Springer, 2007.
Balzer, J.; Dibbelt, J.; Beyerer, J.Puente León, F.; Heizmann, M. (eds.), Bildverarbeitung in der Mess- und Automatisierungstechnik, VDI-Berichte Nr. 1981, pp. 125-136, VDI-Verlag, Düsseldorf, 2007.
Werling, S.; Beyerer, J.Puente León, F.; Heizmann, M. (eds.), Bildverarbeitung in der Mess- und Automatisierungstechnik, VDI-Berichte Nr. 1981, pp. 237-246, VDI-Verlag, Düsseldorf, 2007.
Gheta, I.; Heizmann, M.; Beyerer, J.Puente León, F.; Heizmann, M. (eds.), Bildverarbeitung in der Mess- und Automatisierungstechnik, VDI-Berichte Nr. 1981, pp. 79-90, VDI-Verlag, Düsseldorf, 2007.
Balzer, J.; Werling, S.; Beyerer, J.tm-Technisches Messen 74 Nr. 11, Oldenbourg Verlag, München, pp. 545-552, 2007.
Beyerer, J.; Längle, T.Bauer, N. (Hrsg.): Handbuch zur Industriellen Bildverarbeitung, Fraunhofer-Allianz Vision, Erlangen, pp. 82-84, 2007.
Beyerer, J.Technology Review, pp. 72-73, Heise Zeitschriftenverlag, 2007.
Beyerer, J.Fachinformationstagung Forschung und Technologie für Verteidigung und Sicherheit. Report-Verlag, Bonn, 2007.
Frese, C.; Beyerer, J.Berns, K.; Luksch, T. (Hrsg.): Autonome Mobile Systeme 2007, Informatik aktuell, Springer, pp. 177-183, 2007.
Sander, J.; Beyerer, J.37. Jahrestagung der Gesellschaft für Informatik e.V. (GI): INFORMATIK 2007 - Informatik trifft Logistik, vol. 2, pp. 95-99, 2007.
Werling, S.; Balzer, J.; Beyerer, J.37. Jahrestagung der Gesellschaft für Informatik e.V. (GI): INFORMATIK 2007 - Informatik trifft Logistik, vol. 1, pp. 44-48, 2007.
Gheta, I.; Frese, C.; Heizmann, M.; Beyerer, J.37. Jahrestagung der Gesellschaft für Informatik e.V. (GI): INFORMATIK 2007 - Informatik trifft Logistik, vol. 1, pp. 26-31, 2007.
Beyerer, J. (ed.)Universitätsverlag Karlsruhe, 2007.
Werling, S.; Balzer, J.; Beyerer, J.Grün, A.; Kahmen, H. (eds.), Optical 3-D Measurement Techniques, Zürich, vol. 2, pp. 386-392, 2007.
Gheta, I.; Frese, C.; Krüger, W.; Saur, G.; Heinze, N.; Heizmann, M.; Beyerer, J.Grün, A.; Kahmen, H. (eds.), Optical 3-D Measurement Techniques, Zürich, vol. 2, pp. 119-125, 2007.
Frese, C.; Beyerer, J.; Zimmer, P.Proceedings of IEEE Intelligent Vehicles Symposium, Istanbul, pp. 227-232, 2007.
Werling, S.; Beyerer, J.tm Technisches Messen 74 Nr. 4, Oldenbourg Verlag, München, pp. 217-223, 2007.
Lellmann, J.; Balzer, J.; Rieder, A.; Beyerer, J.Technical report, IWRMM-Preprint Nr. 07/02, 2007.
Beyerer, J.; Sander, J.; Werling, S.tm Technisches Messen 74 Nr. 3, Oldenbourg Verlag, München, pp. 103-111, 2007.
Beyerer, J.; Geisler, J.Strategie und Technik Nr. 2, Report-Verlag, Bonn, pp. 10-12, 2007.
Beyerer, J.; León, F. P.; Sommer, K.-D. (eds.)Universitätsverlag Karlsruhe, 2006.
Beyerer, J.; Sauer, O. (eds.)Fraunhofer IRB Verlag, Stuttgart, 2006.
Beyerer, J.Kompendium des Forums Informationstechnik: Sicherheit - Zukunftstechnologien - Human Factors. Studiengesellschaft der Deutschen Gesellschaft für Wehrtechnik mbH, Bonn, 2006.
Beyerer, J.Fachinformationstagung Forschung und Technologie für die Bundeswehr. CD-ROM, Report-Verlag, Bonn, 2006.
Beyerer, J.; Heizmann, M.Technologieführer: Grundlagen - Anwendungen - Trends. Hans-Jörg Bullinger (Hrsg.), Springer-Verlag, Berlin Heidelberg, pp. 156-161, 2006.
Werling, S.; Beyerer, J.Tagungsband des XX. Symposiums des Arbeitskreises der Hochschullehrer für Messtechnik, Shaker-Verlag, 2006.
Balzer, J.; Werling, S.; Beyerer, J.Huang, P. (Hrsg): Two- and Three-Dimensional Methods for Inspection and Metrology IV, Optics East, Proceedings of SPIE Vol. 6382, 2006.
Sander, J.; Beyerer, J.Proceedings of the 2006 IEEE International Conference on Multisensor Fusion and Integration for Intelligent Systems (MFI06), Heidelberg, pp. 249-254, 2006.
Beyerer, J.; Sommer, K.-D.; Puente León, F. (eds.)Universitätsverlag Karlsruhe, 2006.
Beyerer, J.; Sander, J.; Werling, S.Informationsfusion in der Mess- und Sensortechnik, J. Beyerer, F. Puente León, K.-D. Sommer (Hrsg.), Universitätsverlag Karlsruhe, 2006; Beiträge des VDI/VDE-GMA Expertenforums "Informationsfusion in der Mess- und Sensortechnik 2006", 21., pp. 21-37, 2006.
Beyerer, J.; Sauer, O. (eds.)Fraunhofer IRB Verlag, Stuttgart, 2006.
Beyerer, J.; Heizmann, M.; Sander, J.Multisensor, Multisource Information Fusion: Architectures, Algorithms, and Applications 2006, Belur V. Dasarathy (ed.), Proceedings of SPIE 6242, pp. 235-243, 2006.
Beyerer, J.Studiengesellschaft der deutschen Gesellschaft für Wehrtechnik mbH. Vernetzte Operationsführung am Beispiel des Wirkverbundes Land-Luft-See GREL als Basis für NetOpFü. Bad Godesberg 11.-12.10.2005. Vortrag auf CD. SEG Kompendium des Fo, pp. 3-4, 2005.
Beyerer, J.Gießerei 92, 12 / 2005, Düsseldorf, pp. 54-55, 2005.
Puente León, F.; Beyerer, J.tm Technisches Messen 72 (2005) 12, Oldenbourg Verlag, München, pp. 663-670, 2005.
Beyerer, J.; Puente León, F.at - Automatisierungstechnik 53 (10/2005), Oldenbourg Verlag, München, pp. 493-502, 2005.
Beyerer, J.; Grosche, J.Cremers, A.; Manthey, R.; Martini, P.; Steinhage, V.: Informatik 2005. Informatik LIVE! Band 1. Beiträge der 35. Jahrstagung der Gesellschaft für Informmatik e.v. (GI), 19.-22. September 2005 in Bonn, S. 464 f., 2005.
Beyerer, J.IuK-News, 03/2005, Fraunhofer Gruppe Informations- und Kommunikationstechnik, Berlin 2005. ISSN 18608264, pp. 3-4, 2005.
Beyerer, J.; vom Stein, D.Zusammenfassung des Vortrags zur Grossen Giessereitechnischen Tagung, 2005.
Beyerer, J.28. Heidelberger Bildverarbeitungsforum: Automatische Inspektion komplexer Oberflächen, 2005.
Heizmann, M.; Beyerer, J.Image Processing: Algorithms and Systems IV, E. R. Dougherty, J. T. Astola, K. O. Egiazarian (eds.), Proceedings of SPIE/IS&T Electronic Imaging, SPIE Vol. 5672, pp. 23-33, 2005.
Beyerer, J.; Herzog, R.; Geisler, J.Modeling and Simulation to Address NATO's New and Existing Military Requirements, 2004.
Beyerer, J.Fraunhofer Magazin 4.2004, München, pp. 46-47, 2004.
Beyerer, J.; Bierweiler, T.; vom Stein, D.; Klawitter, T.Casting Plant and Technology International 19 Nr. 4, pp. 24-35, 2003.
Beyerer, J.; vom Stein, D.Foundry Trade Journal, Vol. 177, No. 3610, DMG World Media (uk) ltd, Redhill, Surrey, pp. 12-14, 2003.
Beyerer, J.; Bierweiler, T.; vom Stein, D.; Klawitter, T.Giesserei - Die Zeitschrift der Deutschen Giessereivereinigungen, 90. Jahrgang, Nr. 7, VDG Verein Deutscher Gießereifachleute e. V., Düsseldorf, pp. 26-31, 2003.
Beyerer, J.Tagungsband des WFO Technical Forum 2003, S. 6.2, VDG Verein Deutscher Giessereifachleute e.V., Düsseldorf, 2003.
Beyerer, J.; vom Stein, D.; Klawitter, T.Giesserei-Erfahrungsaustausch, 47. Jahrgang, Nr. 7, Verlag Erfahrungsaustausch GmbH, Heddesheim, pp. 283-286, 2003.
Beyerer, J.; vom Stein, D.; Klawitter, T.Cast Metal Times, Vol. 5, No. 4, 2003, Modern Media Communications, Shoreham by Sea, pp. 58-60, 2003.
Beyerer, J.; vom Stein, D.; Klawitter, T.Hommes & Fonderie, Nr. 333, Paris, pp. 30-34, 2003.
Beyerer, J.; Puente León, F.at - Automatisierungstechnik 50, Nr. 10, pp. 472-480, 2002.
Beyerer, J.Tagungsband "Berichte aus Wissenschaft und Praxis" zu den 4. Formstoff-Tagen, Duisburg, 2002.
Beyerer, J.Giesserei-Erfahrungsaustausch, Verlag Erfahrungsaustausch Heddesheim, Heft 8/2002, pp. 350-354, 2002.
Beyerer, J.Cast Metal Time 3 no. 6, pp. 30-33, Modern Media Communications, 2001.
Beyerer, J.Gießerei-Praxis, Fachverlag Schiele & Schön Berlin, Heft 11, pp. 454-456, 2001.
Beyerer, J.; Krahe, D.; Puente León, F.Metrology and Properties of Engineering Surfaces, Kapitel 7. Hrsg.: E. Mainsah, J.A. Greenwood, D.G. Chetwynd, Kluwer Academic Publishers, Boston, pp. 243-281, 2001.
Beyerer, J.Cast Metal Times, Vol. 3, No. 6, October/November 2001, Modern Media Communications, Shoreham by Sea, pp. 30-33, 2001.
Beyerer, J.; Seiraffi, M.Hommes & Fonderie, Nr. 314, Paris, pp. 44-55, 2001.
Müller, G.; Seiraffi, M.; Beyerer, J.Automative Casting Processes and Materials, Tagungsband zum SAE 2001 World Congress in Detroit, Society of Automotive Engineers Inc., Warrendale, pp. 99-110, 2001.
Mesch, F.; Beyerer, J.Measurement Science - A Discussion, Hrsg.: Kariya, K. und Finkelstein, L., Omsha, Ltd., Tokyo, pp. 149-167, 2000.
Beyerer, J.; Seiraffi, M.Hommes & Fonderie, Nr. 306, Paris, pp. 23-31, 2000.
Beyerer, J.VDI Berichte 1572: Bildverarbeitung im industriellen Einsatz, VDI Verlag, Düsseldorf, pp. 95-100, 2000.
Beyerer, J.; Seiraffi, M.Gießerei-Praxis, Fachverlag Schiele & Schön Berlin, Heft 6, pp. 245-254, 2000.
Beyerer, J.; Mesch, F.Proceedings of the International Workshop on Advances of Measurement Sciences, IMEKO, SICE, Kyoto, Japan, June, pp. 209-227, 1999.
Beyerer, J.; Karrais, A.; Schön, W.-U.Giesserei 86, Nr. 9, pp. 116-118, 1999.
Beyerer, J.VDI Fortschritt-Berichte, Reihe 8, Nr. 783, VDI Verlag, Düsseldorf, 1999.
Puente León, F.; Beyerer, J.SPIE's Internat. Symposium on Intelligent Systems & Advanced Manufacturing, Boston, 1999.
Beyerer, J.; Seiraffi, M.; Winkel, T.Proceedings of the CONAF 99, Sao Paulo, Brasilien, 1999.
Beyerer, J.Measurement - Journal of the IMEKO, Elsevier, Vol. 25, No. 1, pp. 1-7, 1999.
Krahe, D.; Beyerer, J.ITG-Fachtagung, Sensoren und Meßtechnik, Bad Nauheim, 9.-11. März, pp. 512-528, 1998.
Beyerer, J.; Puente León, F.Optical Engineering, Vol. 37, No. 10, pp. 2733-2741, 1998.
Beyerer, J.; Krahe, D.Tagungsband zur WTA '98 Workshop on Texture Analysis, Hrsg.: H. Burkhard, Freiburg, 1998.
Beyerer, J.Signal Processing, Elsevier, Vol. 68, Nr. 1, pp. 107-111, 1998.
Beyerer, J.; Puente León, F.Optical Engineering, Vol. 36, No. 1, pp. 85-93, 1997.
Puente León, F.; Beyerer, J.at - Automatisierungstechnik, Oldenbourg, Vol. 45, Nr. 10, pp. 480-489, 1997.
Beyerer, J.; Pérard, D.tm - Technisches Messen 64, Oldenbourg, Nr. 10, pp. 394-400, 1997.
Beyerer, J.; Trächtler, A.tm - Technisches Messen 64, Oldenbourg, Nr. 10, pp. 401-407, 1997.
Puente León, F.; Beyerer, J.Proc. of SPIE, Vol. 3208, Intelligent Robots and Computer Vision XVI, Pittsburgh, pp. 394-405, 1997.
Armbruster, K.; Beyerer, J.; Bröcher, B.; Föhr, R.; Friedrich, A.; Neddermeyer, W.atp - Automatisierungstechnische Praxis 39 (1997) 4, R.Oldenbourg Verlag München, pp. 22-33, 1997.
Krahe, D.; Beyerer, J.Proceedings of SPIE, Vol. 3203, Architectures, Networks, and Intelligent Systems for Manufacturing Integration, Pittsburgh, pp. 192-201, 1997.
Pérard, D.; Beyerer, J.Proceedings of SPIE, Vol. 3204, Three-Dimensional Imaging and Laser-based Systems for Metrology and Inspection III, Pittsburgh, pp. 75-80, 1997.
Puente León, F.; Beyerer, J.BKA-Symposium der AG Schußwaffen/Ballistik Wenningen, 1997.
Beyerer, J.XIV IMEKO World Congress, Vol. 5, Tampere, Finnland, pp. 95-100, 1997.
Beyerer, J.; Krahe, D.Tagungsband der 7th International Conference on Metrology and Properties of Engineering Surfaces, Göteborg, Schweden, pp. 396-403, 1997.
Beyerer, J.; Puente Léon, F.Tagungsband zum IPK-Workshop: Bildauswertung für Handel, Banken und Behörden, Methoden - Systeme - Anwendungen, Berlin 19.-20. Feb., pp. 12-16, 1997.
Beyerer, J.; Puente Léon, F.International Journal of Machine Tools & Manufacture, Pergamon, Vol. 37, No. 3, pp. 371-389, 1997.
Beyerer, J.; Puente-León, F.IPR Workshop und Ausstellung für Handel, Banken und Behördern, pp. 1-5, 1997.
Beyerer, J.Measurement - Journal of the IMEKO, Elsevier, Vol. 18, No. 4, pp. 225-235, 1996.
Bucourt, S.; Beyerer, J.; Ulmer, G.; Sirat, G.Vision Systems: Applications, Panayotis, K.A.; Nickolay, B. (editors), SPIE Vol. 2786, pp. 139-145, 1996.
Beyerer, J.tm - Technisches Messen 63 no. 5, pp. 182-190, Oldenbourg, 1996.
Beyerer, J.Tagungsband der 3. Fachtagung Honen, Vulkan-Verlag, Essen, pp. 9.1-9.17, 1995.
Beyerer, J.; Puente León, F.Symposium Schußwaffen/Schußwaffenspuren, Ludwigshafen, 1995.
Beyerer, J.Measurement - Journal of the IMEKO, Elsevier, Vol. 15, No. 3, pp. 189-199, 1995.
Beyerer, J.; Greiner, T.GMA-Aussprachetag Meßsignalverarbeitung und Diagnose, 21./22.03.1995 in Langen, GMA-Bericht 24, pp. 165-174, 1995.
Beyerer, J.VIII. Meßtechnisches Symposium, Berlin, pp. 77-93, 1994.
Beyerer, J.Dissertation, VDI-Fortschritt-Berichte, Reihe 8, Nr. 390, VDI Verlag, Düsseldorf, 1994.
Beyerer, J.tm - Technisches Messen 60, Nr. 11, pp. 419-424, 1993.
Beyerer, J.State and Advances of Measurement and Instrumentation Science, hrsg. von L. Finkelstein und K.T.V. Grattan, City University Press, London, pp. 360-369, 1993.
Beyerer, J.tm - Technisches Messen 59, Nr. 10, pp. 389-397, 1992.
Beyerer, J.36. Internationales Wissenschaftliches Kolloquium, Ilmenau, pp. 433-438, 1991.
Beyerer, J.25. Regelungstechnisches Kolloquium, 1991.
Beyerer, J.Chip-Special 4/81: Bauanleitung für Mikrocomputer, Vogel-Verlag Würzburg, pp. 84-85, 1981.