Proceedings of SPIE 0277-786X, Volume 8791. Videometrics, Range Imaging, and Applications XII; and Automated Visual Inspection

Conference proceedings

Links:
Editors:

Fabio Remondino
Mark Shortis
Jürgen Beyerer
Fernando Puente León

Source:

SPIE Optical Metrology, 2016.

Conference:

Videometrics, Range Imaging, and Applications XII; and Automated Visual Inspection, Munich, Germany, May 14 - 16, 2016