About the Acquisition and Processing of Ray Deflection Histograms for Transparent Object Inspection

Conference paper

Links:
Authors:

Johannes Meyer
Thomas Längle
Jürgen Beyerer

Source:

Irish Machine Vision & Image Processing Conference Proceedings 2016, 2016.

Pages:

9-16

Conference:

Irish Machine Vision & Image Processing Conference 2016, Galway, Ireland, August 2016