General Cramér-von Mises, a Helpful Ally for Transparent Object Inspection using Deflection Maps?

Conference paper

Links:
Authors:

Johannes Meyer
Thomas Längle
Jürgen Beyerer

Source:

20th Scandinavian Conference on Image Analysis (SCIA 2017), Springer, Cham, 2017.

Pages:

526-537

Conference:

20th Scandinavian Conference on Image Analysis (SCIA 2017), Tromsø, Norway, June 12 - 14, 2017

ISBN:

978-3-319-59125-4