Towards many-class classification of materials based on their spectral fingerprints

Conference paper

Links:
Authors:

Matthias Richter
Jürgen Beyerer

Source:

Jürgen Beyerer, Fernando Puente León, Thomas Längle (eds.), OCM 2015 - Optical Characterization of Materials - conference proceedings , KIT Scientific Publishing, 2015.

Pages:

103-112

Conference:

2nd International Conference on Optical Characterization of Materials, Karlsruhe, March 18 - 19, 2015